Quasi-optics vector measurements of dielectrics from 8 GHz to the THz

P. Goy, S. Caroopen, M. Gross, J. Mallat, Jussi Tuovinen, F. Mattiocco

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

1 Citation (Scopus)

Abstract

Dielectric characterisation is made easier when using vector measurements. These measurements give directly the permittivity, since the phase rotation corresponds to a lengthening of the optical path across the sample. Measurements that are most commonly done are measurements between horns (most of the time by taking advantage of refocusing lenses). The comparison between the detected phase and amplitude with or without the sample gives the permittivity ϑ' and the loss tanδ. The vector analysis (circular shaped resonance in polar plot) allows complete and precise measurement from any form of resonance. Vector measurements in the range of 8 to 1000 GHz are made possible thanks to the vector network analyser.
Original languageEnglish
Title of host publication1998 IEEE Sixth International Conference on Terahertz Electronics Proceedings (THZ 98)
PublisherIEEE Institute of Electrical and Electronic Engineers
ISBN (Print)0-7803-4903-2
DOIs
Publication statusPublished - 1998
MoE publication typeA4 Article in a conference publication

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