Keyphrases
Transfer Standard
100%
Scanning White Light Interferometer
100%
Vertical Scaling
40%
Reference Plane
40%
Measurement Results
20%
Repeatability
20%
Light Source
20%
Interferometer
20%
Laser Interferometry
20%
Capacitive Sensor
20%
Moving Mirrors
20%
Light-emitting Diodes
20%
Reference Instrument
20%
Micro-nano
20%
CCD Camera
20%
Duty Cycle
20%
Halogen Light
20%
Halogen Lamp
20%
Error Characterization
20%
Amplification Coefficient
20%
Scale Calibration
20%
Piezo
20%
Static Motion
20%
Invar Steel
20%
Flexure
20%
Sensor Feedback
20%
Nanoelectromechanical Systems
20%
Error Calibration
20%
Static Features
20%
Vertical Position
20%
Scale Amplification
20%
Traceable Calibration
20%
Out-of-plane Movement
20%
INIS
calibration
100%
interferometers
100%
mirrors
50%
halogens
33%
devices
33%
errors
33%
feedback
16%
motion
16%
sensors
16%
range
16%
cameras
16%
lasers
16%
amplification
16%
steels
16%
meters
16%
interferometry
16%
light sources
16%
lamps
16%
ccd
16%
light emitting diodes
16%
invar
16%
Engineering
Reference Plane
100%
Traceability
50%
Capacitive
50%
Repeatability
50%
Duty Cycle
50%
Light-Emitting Diode
50%
Feedback Sensor
50%
Electromechanical System
50%
Flexure
50%
Light Source
50%
Interferometry
50%