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Radiation tests of CMS RPC muon trigger electronic components

  • Karol Bunkowski*
  • , Ivan Kassamakov
  • , Jan Krolikowski
  • , Krzysztof Kierzkowski
  • , Maciej Kuda
  • , Teppo Mäenpää
  • , Krysztof Pozniak
  • , Dominik Rybka
  • , Eija Tuominen
  • , Donatella Ungaro
  • , Grzegorz Wrochna
  • , Wojciech Zabootny
  • *Corresponding author for this work
  • Warsaw University of Technology
  • National Centre for Nuclear Research (NCBJ)
  • University of Warsaw
  • University of Helsinki
  • Helsinki Institute of Physics (HIP)

Research output: Contribution to journalArticleScientificpeer-review

Abstract

The results of proton irradiation test of electronic devices, selected for the RPC trigger electronic system of the CMS detector, will be presented. For Xilinx Spartan-IIE FPGA the cross-section for Single Event Upsets (SEUs) in configuration bits was measured. The dynamic SEUs in flip-flops were also investigated, but not observed. For the FLASH memories no single upsets were detected. Only after irradiating with a huge dose permanent damages of devices were observed. For Synchronous Dynamic Random Access Memory (SDRAM), the SEU cross-section was measured. (C) 2004 Elsevier B.V. All rights reserved.
Original languageEnglish
Pages (from-to)708-717
JournalNuclear Instruments and Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume538
Issue number1-3
DOIs
Publication statusPublished - 2005
MoE publication typeA1 Journal article-refereed

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