Abstract
The results of proton irradiation test of electronic devices, selected for the RPC trigger electronic system of the CMS detector, will be presented. For Xilinx Spartan-IIE FPGA the cross-section for Single Event Upsets (SEUs) in configuration bits was measured. The dynamic SEUs in flip-flops were also investigated, but not observed. For the FLASH memories no single upsets were detected. Only after irradiating with a huge dose permanent damages of devices were observed. For Synchronous Dynamic Random Access Memory (SDRAM), the SEU cross-section was measured. (C) 2004 Elsevier B.V. All rights reserved.
| Original language | English |
|---|---|
| Pages (from-to) | 708-717 |
| Journal | Nuclear Instruments and Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors and Associated Equipment |
| Volume | 538 |
| Issue number | 1-3 |
| DOIs | |
| Publication status | Published - 2005 |
| MoE publication type | A1 Journal article-refereed |
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