Recent Advances in Master Curve Technology

Kim Wallin, Anssi Laukkanen, Pekka Nevasmaa, Tapio Planman

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    Abstract

    The Master Curve methodology is a statistical, theoretical, micromechanism based, analysis method for fracture toughness in the ductile to brittle transition region. The method, originally developed at VTT Manufacturing Technology" simultaneously account for the scatter, size effects and temperature dependence of fracture toughness. The method has been successfully applied to a very large number of different ferritic steels and it forms the basis of the ASTM testing standard for fracture toughness testing in the transition region. The Master Curve (MC) methodology has evolved from only being a brittle fracture testing and analysis procedure to a technological tool capable of addressing many more structural integrity issues like constraint and parameter transferability. Here, some recent advances of the technology are presented. The advances include eg. constraint adjustment, description of warm pre-stress effects, analysis of inhomogenous materials and assessment of real three-dimensional flaws.
    Original languageEnglish
    Title of host publication11th International Conference on Fracture 2005, ICF 11
    PublisherCurran Associates Inc.
    Pages4211-4216
    Volume6
    ISBN (Print) 978-1-61782-063-2
    Publication statusPublished - 2005
    MoE publication typeA4 Article in a conference publication
    Event11th International Conference on Fracture, IFC11 - Turin, Italy
    Duration: 20 Mar 200525 Mar 2005
    Conference number: 11

    Conference

    Conference11th International Conference on Fracture, IFC11
    Abbreviated titleIFC11
    Country/TerritoryItaly
    CityTurin
    Period20/03/0525/03/05

    Keywords

    • ProperTune

    Fingerprint

    Dive into the research topics of 'Recent Advances in Master Curve Technology'. Together they form a unique fingerprint.

    Cite this