Abstract
Knowledge of the mean-free-path distribution of
heat-carrying phonons is key to understanding
phonon-mediated thermal transport. We demonstrate that
thermal conductivity measurements of thin membranes
spanning a wide thickness range can be used to
characterize how bulk thermal conductivity is distributed
over phonon mean free paths. A noncontact transient
thermal grating technique was used to measure the thermal
conductivity of suspended Si membranes ranging from
15-1500 nm in thickness. A decrease in the thermal
conductivity from 74-13% of the bulk value is observed
over this thickness range, which is attributed to diffuse
phonon boundary scattering. Due to the well-defined
relation between the membrane thickness and phonon
mean-free-path suppression, combined with the range and
accuracy of the measurements, we can reconstruct the bulk
thermal conductivity accumulation vs. phonon mean free
path, and compare with theoretical models.
Original language | English |
---|---|
Article number | 245423 |
Journal | Physical Review B: Condensed Matter and Materials Physics |
Volume | 91 |
Issue number | 24 |
DOIs | |
Publication status | Published - 2015 |
MoE publication type | A1 Journal article-refereed |