Abstract
Knowledge of the mean-free-path distribution of
heat-carrying phonons is key to understanding
phonon-mediated thermal transport. We demonstrate that
thermal conductivity measurements of thin membranes
spanning a wide thickness range can be used to
characterize how bulk thermal conductivity is distributed
over phonon mean free paths. A noncontact transient
thermal grating technique was used to measure the thermal
conductivity of suspended Si membranes ranging from
15-1500 nm in thickness. A decrease in the thermal
conductivity from 74-13% of the bulk value is observed
over this thickness range, which is attributed to diffuse
phonon boundary scattering. Due to the well-defined
relation between the membrane thickness and phonon
mean-free-path suppression, combined with the range and
accuracy of the measurements, we can reconstruct the bulk
thermal conductivity accumulation vs. phonon mean free
path, and compare with theoretical models.
| Original language | English |
|---|---|
| Article number | 245423 |
| Journal | Physical Review B: Condensed Matter and Materials Physics |
| Volume | 91 |
| Issue number | 24 |
| DOIs | |
| Publication status | Published - 2015 |
| MoE publication type | A1 Journal article-refereed |
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