Reduction of the thermal conductivity in free-standing silicon nano-membranes investigated by non-invasive Raman thermometry

E Chavez-Angel, J S Reparaz, J Gomis-Bresco, M R Wagner, J Cuffe, B Graczykowski, Andrey Shchepetov, H Jiang, Mika Prunnila, Jouni Ahopelto, F Alzina, C M Sotomayor Torres (Corresponding Author)

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    Abstract

    We report on the reduction of the thermal conductivity in ultra-thin suspended Si membranes with high crystalline quality. A series of membranes with thicknesses ranging from 9 nm to 1.5 ìm was investigated using Raman thermometry, a novel contactless technique for thermal conductivity determination. A systematic decrease in the thermal conductivitywas observed as reducing the thickness, which is explained using the Fuchs-Sondheimer model through the influence of phonon boundary scattering at the surfaces. The thermal conductivity of the thinnest membrane with d = 9 nm resulted in (9 ± 2) W/mK, thus approaching the amorphous limit but still maintaining a high crystalline quality.
    Original languageEnglish
    JournalAPL Materials
    Volume2
    Issue number1
    DOIs
    Publication statusPublished - 2014
    MoE publication typeA1 Journal article-refereed

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    Silicon
    Thermal conductivity
    Membranes
    Crystalline materials
    Scattering

    Cite this

    Chavez-Angel, E., Reparaz, J. S., Gomis-Bresco, J., Wagner, M. R., Cuffe, J., Graczykowski, B., ... Sotomayor Torres, C. M. (2014). Reduction of the thermal conductivity in free-standing silicon nano-membranes investigated by non-invasive Raman thermometry. APL Materials, 2(1). https://doi.org/10.1063/1.4861796
    Chavez-Angel, E ; Reparaz, J S ; Gomis-Bresco, J ; Wagner, M R ; Cuffe, J ; Graczykowski, B ; Shchepetov, Andrey ; Jiang, H ; Prunnila, Mika ; Ahopelto, Jouni ; Alzina, F ; Sotomayor Torres, C M. / Reduction of the thermal conductivity in free-standing silicon nano-membranes investigated by non-invasive Raman thermometry. In: APL Materials. 2014 ; Vol. 2, No. 1.
    @article{49b2527d09b94e9a86a44d8cb48a68d0,
    title = "Reduction of the thermal conductivity in free-standing silicon nano-membranes investigated by non-invasive Raman thermometry",
    abstract = "We report on the reduction of the thermal conductivity in ultra-thin suspended Si membranes with high crystalline quality. A series of membranes with thicknesses ranging from 9 nm to 1.5 {\`i}m was investigated using Raman thermometry, a novel contactless technique for thermal conductivity determination. A systematic decrease in the thermal conductivitywas observed as reducing the thickness, which is explained using the Fuchs-Sondheimer model through the influence of phonon boundary scattering at the surfaces. The thermal conductivity of the thinnest membrane with d = 9 nm resulted in (9 ± 2) W/mK, thus approaching the amorphous limit but still maintaining a high crystalline quality.",
    author = "E Chavez-Angel and Reparaz, {J S} and J Gomis-Bresco and Wagner, {M R} and J Cuffe and B Graczykowski and Andrey Shchepetov and H Jiang and Mika Prunnila and Jouni Ahopelto and F Alzina and {Sotomayor Torres}, {C M}",
    year = "2014",
    doi = "10.1063/1.4861796",
    language = "English",
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    Chavez-Angel, E, Reparaz, JS, Gomis-Bresco, J, Wagner, MR, Cuffe, J, Graczykowski, B, Shchepetov, A, Jiang, H, Prunnila, M, Ahopelto, J, Alzina, F & Sotomayor Torres, CM 2014, 'Reduction of the thermal conductivity in free-standing silicon nano-membranes investigated by non-invasive Raman thermometry', APL Materials, vol. 2, no. 1. https://doi.org/10.1063/1.4861796

    Reduction of the thermal conductivity in free-standing silicon nano-membranes investigated by non-invasive Raman thermometry. / Chavez-Angel, E; Reparaz, J S; Gomis-Bresco, J; Wagner, M R; Cuffe, J; Graczykowski, B; Shchepetov, Andrey; Jiang, H; Prunnila, Mika; Ahopelto, Jouni; Alzina, F; Sotomayor Torres, C M (Corresponding Author).

    In: APL Materials, Vol. 2, No. 1, 2014.

    Research output: Contribution to journalArticleScientificpeer-review

    TY - JOUR

    T1 - Reduction of the thermal conductivity in free-standing silicon nano-membranes investigated by non-invasive Raman thermometry

    AU - Chavez-Angel, E

    AU - Reparaz, J S

    AU - Gomis-Bresco, J

    AU - Wagner, M R

    AU - Cuffe, J

    AU - Graczykowski, B

    AU - Shchepetov, Andrey

    AU - Jiang, H

    AU - Prunnila, Mika

    AU - Ahopelto, Jouni

    AU - Alzina, F

    AU - Sotomayor Torres, C M

    PY - 2014

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    AB - We report on the reduction of the thermal conductivity in ultra-thin suspended Si membranes with high crystalline quality. A series of membranes with thicknesses ranging from 9 nm to 1.5 ìm was investigated using Raman thermometry, a novel contactless technique for thermal conductivity determination. A systematic decrease in the thermal conductivitywas observed as reducing the thickness, which is explained using the Fuchs-Sondheimer model through the influence of phonon boundary scattering at the surfaces. The thermal conductivity of the thinnest membrane with d = 9 nm resulted in (9 ± 2) W/mK, thus approaching the amorphous limit but still maintaining a high crystalline quality.

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    DO - 10.1063/1.4861796

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    JO - APL Materials

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