Abstract
| Original language | English |
|---|---|
| Pages (from-to) | 1708 - 1709 |
| Number of pages | 2 |
| Journal | Electronics Letters |
| Volume | 27 |
| Issue number | 19 |
| DOIs | |
| Publication status | Published - 1991 |
| MoE publication type | A1 Journal article-refereed |
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Reflections in anechoic chambers in 100-200 GHz range. / Lehto, A.; Tuovinen, Jussi; Räisänen, Antti.
In: Electronics Letters, Vol. 27, No. 19, 1991, p. 1708 - 1709.Research output: Contribution to journal › Article › Scientific › peer-review
TY - JOUR
T1 - Reflections in anechoic chambers in 100-200 GHz range
AU - Lehto, A.
AU - Tuovinen, Jussi
AU - Räisänen, Antti
PY - 1991
Y1 - 1991
N2 - Three anechoic chambers have been tested at 110 and 183 GHz. Typical sidewall reflectivity levels are about -60 dB at 110 GHz and -50 dB at 183 GHz measured with pyramidal horns which have a gain of 20 dB. Backwall reflectivity levels are about -35 dB at 110 GHz and -25 dB at 183 GHz.
AB - Three anechoic chambers have been tested at 110 and 183 GHz. Typical sidewall reflectivity levels are about -60 dB at 110 GHz and -50 dB at 183 GHz measured with pyramidal horns which have a gain of 20 dB. Backwall reflectivity levels are about -35 dB at 110 GHz and -25 dB at 183 GHz.
U2 - 10.1049/el:19911063
DO - 10.1049/el:19911063
M3 - Article
VL - 27
SP - 1708
EP - 1709
JO - Electronics Letters
JF - Electronics Letters
SN - 0013-5194
IS - 19
ER -