Refractive index devetion using a self-mixing interferometer

Miia Määttälä, Jukka Hast, Risto Myllylä

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

Abstract

A self-mixing interferometer is proposed to detect the change of refractive index of a sample. As light source, the developed measurement system uses a blue emitting GaN laser diode. An external mirror, driven by a piezo nanopositioner, is used to reflect the light and produce an interference signal which is detected with the monitor photodiode of the laser. The change of the refractive index is demonstrated by changing the optical path length of the external cavity by changing the offset-voltage of the piezo positioner. This introduces a phase difference to the interference signal. The results show that by considering the measured sensitivity of the setup, about 1,9x10-7 changes in the refractive index can be detected in 1 cm optical path length.
Original languageEnglish
Title of host publicationProceedings of ODIMAP V
Subtitle of host publication5th Topical Meeting on Optoelectronic Distance/Displacement Measurements and Applications
Place of PublicationSpain
PublisherIEEE Institute of Electrical and Electronic Engineers
Pages315-320
ISBN (Print)84-690-0938-9
Publication statusPublished - 2006
MoE publication typeA4 Article in a conference publication
Event5th Topical Meeting on Optoelectronic Distance/Displacement Measurement and Applications - Madrid, Spain
Duration: 2 Oct 20064 Oct 2006

Conference

Conference5th Topical Meeting on Optoelectronic Distance/Displacement Measurement and Applications
Abbreviated titleODIMAP V
CountrySpain
CityMadrid
Period2/10/064/10/06

Keywords

  • interferometry
  • fringe pattern analysis
  • time domain methods
  • biosensor

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  • Cite this

    Määttälä, M., Hast, J., & Myllylä, R. (2006). Refractive index devetion using a self-mixing interferometer. In Proceedings of ODIMAP V: 5th Topical Meeting on Optoelectronic Distance/Displacement Measurements and Applications (pp. 315-320). IEEE Institute of Electrical and Electronic Engineers.