Reliability of silkscreen printed planar capacitors and inductors under accelerated thermal cycling and humidity bias life testing

Juha Veikko Voutilainen, Tuomas Happonen, Juha Häkkinen

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

2 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Reliability of silkscreen printed planar capacitors and inductors under accelerated thermal cycling and humidity bias life testing'. Together they form a unique fingerprint.

Engineering & Materials Science