Reliability simulation model for systems with multiple intermediate storages

Helena Kortelainen, Jukka Salmikuukka, Saku Pursio

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    3 Citations (Scopus)

    Abstract

    A reliability model that describes a complex industrial system is presented. The model utilizes industrial data that in this case is mainly derived from engineer judgements. A method to incorporate intermediate storages into the reliability model, and the estimation of the influence of the storage capacity on the system reliability is presented.

    Original languageEnglish
    Title of host publicationAnnual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity
    PublisherIEEE Institute of Electrical and Electronic Engineers
    Pages65-70
    Number of pages6
    Volume2
    Edition8
    ISBN (Print)0-7803-5848-1
    DOIs
    Publication statusPublished - 1 Jan 2000
    MoE publication typeA4 Article in a conference publication
    EventAnnual Reliability and Maintainability Symposium: Advancing the Technology - A Commitment to Lifelong Learning - Los Angeles, CA, USA
    Duration: 24 Jan 200027 Jan 2000

    Publication series

    SeriesProceedings of the Annual Reliability and Maintainability Symposium
    ISSN0149-144X

    Conference

    ConferenceAnnual Reliability and Maintainability Symposium: Advancing the Technology - A Commitment to Lifelong Learning
    CityLos Angeles, CA, USA
    Period24/01/0027/01/00

    Fingerprint Dive into the research topics of 'Reliability simulation model for systems with multiple intermediate storages'. Together they form a unique fingerprint.

  • Cite this

    Kortelainen, H., Salmikuukka, J., & Pursio, S. (2000). Reliability simulation model for systems with multiple intermediate storages. In Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (8 ed., Vol. 2, pp. 65-70). IEEE Institute of Electrical and Electronic Engineers. Proceedings of the Annual Reliability and Maintainability Symposium https://doi.org/10.1109/RAMS.2000.816285