Abstract
A reliability model that describes a complex industrial system is presented. The model utilizes industrial data that in this case is mainly derived from engineer judgements. A method to incorporate intermediate storages into the reliability model, and the estimation of the influence of the storage capacity on the system reliability is presented.
| Original language | English |
|---|---|
| Title of host publication | Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity |
| Publisher | IEEE Institute of Electrical and Electronic Engineers |
| Pages | 65-70 |
| Number of pages | 6 |
| Volume | 2 |
| Edition | 8 |
| ISBN (Print) | 0-7803-5848-1 |
| DOIs | |
| Publication status | Published - 1 Jan 2000 |
| MoE publication type | A4 Article in a conference publication |
| Event | Annual Reliability and Maintainability Symposium: Advancing the Technology - A Commitment to Lifelong Learning - Los Angeles, CA, USA Duration: 24 Jan 2000 → 27 Jan 2000 |
Publication series
| Series | Proceedings of the Annual Reliability and Maintainability Symposium |
|---|---|
| ISSN | 0149-144X |
Conference
| Conference | Annual Reliability and Maintainability Symposium: Advancing the Technology - A Commitment to Lifelong Learning |
|---|---|
| City | Los Angeles, CA, USA |
| Period | 24/01/00 → 27/01/00 |
Fingerprint Dive into the research topics of 'Reliability simulation model for systems with multiple intermediate storages'. Together they form a unique fingerprint.
Cite this
Kortelainen, H., Salmikuukka, J., & Pursio, S. (2000). Reliability simulation model for systems with multiple intermediate storages. In Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (8 ed., Vol. 2, pp. 65-70). IEEE Institute of Electrical and Electronic Engineers. Proceedings of the Annual Reliability and Maintainability Symposium https://doi.org/10.1109/RAMS.2000.816285