Reliability test program for submillimeter-wave low-noise amplifiers

Mikko Kantanen; Jussi Varis; Mikko Kärkkäinen; Arnulf Leuther; Axel Tessmann; Markus Rösch; Jouni Lätti

doi:10.1109/IRMMW-THz61557.2025.11319659

Reliability test program for submillimeter-wave low-noise amplifiers

Mikko Kantanen^*
, Jussi Varis
, Mikko Kärkkäinen
, Arnulf Leuther
, Axel Tessmann
, Markus Rösch
, Jouni Lätti

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

Abstract

This paper presents the key findings from reliability testing campaign for sub-millimeter wave amplifiers. A total of 48 packaged amplifiers at two nominal center frequencies, 243 GHz and 330 GHz, undergoes a reliability test program consisting of step stress tests, life tests, humidity tests, as well as environmental and mechanical tests. The results will provide new information for future Earth Observation missions.

Original language	English
Title of host publication	50th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2025
Publisher	IEEE Institute of Electrical and Electronic Engineers
ISBN (Electronic)	9798350378832
DOIs	https://doi.org/10.1109/IRMMW-THz61557.2025.11319659
Publication status	Published - 2025
MoE publication type	A4 Article in a conference publication
Event	50th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2025 - Espoo, Finland Duration: 17 Aug 2025 → 22 Aug 2025

Publication series

Series	International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
ISSN	2162-2027

Conference

Conference	50th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2025
Country/Territory	Finland
City	Espoo
Period	17/08/25 → 22/08/25

Funding

The work has been carried out under ESA contract no. 4000137920/22/NL/FE.

Access to Document

10.1109/IRMMW-THz61557.2025.11319659

Cite this

Kantanen, M., Varis, J., Kärkkäinen, M., Leuther, A., Tessmann, A., Rösch, M., & Lätti, J. (2025). Reliability test program for submillimeter-wave low-noise amplifiers. In 50th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2025 IEEE Institute of Electrical and Electronic Engineers. https://doi.org/10.1109/IRMMW-THz61557.2025.11319659

Kantanen, Mikko ; Varis, Jussi ; Kärkkäinen, Mikko et al. / Reliability test program for submillimeter-wave low-noise amplifiers. 50th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2025. IEEE Institute of Electrical and Electronic Engineers, 2025. (International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz).

@inproceedings{b5c87f0c77e24b4782eac74cd48e1ee2,

title = "Reliability test program for submillimeter-wave low-noise amplifiers",

abstract = "This paper presents the key findings from reliability testing campaign for sub-millimeter wave amplifiers. A total of 48 packaged amplifiers at two nominal center frequencies, 243 GHz and 330 GHz, undergoes a reliability test program consisting of step stress tests, life tests, humidity tests, as well as environmental and mechanical tests. The results will provide new information for future Earth Observation missions.",

author = "Mikko Kantanen and Jussi Varis and Mikko K{\"a}rkk{\"a}inen and Arnulf Leuther and Axel Tessmann and Markus R{\"o}sch and Jouni L{\"a}tti",

year = "2025",

doi = "10.1109/IRMMW-THz61557.2025.11319659",

language = "English",

series = "International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz",

publisher = "IEEE Institute of Electrical and Electronic Engineers",

booktitle = "50th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2025",

address = "United States",

note = "50th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2025 ; Conference date: 17-08-2025 Through 22-08-2025",

}

Kantanen, M , Varis, J, Kärkkäinen, M, Leuther, A, Tessmann, A, Rösch, M & Lätti, J 2025, Reliability test program for submillimeter-wave low-noise amplifiers. in 50th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2025. IEEE Institute of Electrical and Electronic Engineers, International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz, 50th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2025, Espoo, Finland, 17/08/25. https://doi.org/10.1109/IRMMW-THz61557.2025.11319659

Reliability test program for submillimeter-wave low-noise amplifiers. / Kantanen, Mikko ; Varis, Jussi; Kärkkäinen, Mikko et al.
50th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2025. IEEE Institute of Electrical and Electronic Engineers, 2025. (International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz).

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

TY - GEN

T1 - Reliability test program for submillimeter-wave low-noise amplifiers

AU - Kantanen, Mikko

AU - Varis, Jussi

AU - Kärkkäinen, Mikko

AU - Leuther, Arnulf

AU - Tessmann, Axel

AU - Rösch, Markus

AU - Lätti, Jouni

PY - 2025

Y1 - 2025

N2 - This paper presents the key findings from reliability testing campaign for sub-millimeter wave amplifiers. A total of 48 packaged amplifiers at two nominal center frequencies, 243 GHz and 330 GHz, undergoes a reliability test program consisting of step stress tests, life tests, humidity tests, as well as environmental and mechanical tests. The results will provide new information for future Earth Observation missions.

AB - This paper presents the key findings from reliability testing campaign for sub-millimeter wave amplifiers. A total of 48 packaged amplifiers at two nominal center frequencies, 243 GHz and 330 GHz, undergoes a reliability test program consisting of step stress tests, life tests, humidity tests, as well as environmental and mechanical tests. The results will provide new information for future Earth Observation missions.

UR - https://www.scopus.com/pages/publications/105032723799

U2 - 10.1109/IRMMW-THz61557.2025.11319659

DO - 10.1109/IRMMW-THz61557.2025.11319659

M3 - Conference article in proceedings

AN - SCOPUS:105032723799

T3 - International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz

BT - 50th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2025

PB - IEEE Institute of Electrical and Electronic Engineers

T2 - 50th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2025

Y2 - 17 August 2025 through 22 August 2025

ER -

Kantanen M , Varis J, Kärkkäinen M, Leuther A, Tessmann A, Rösch M et al. Reliability test program for submillimeter-wave low-noise amplifiers. In 50th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2025. IEEE Institute of Electrical and Electronic Engineers. 2025. (International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz). doi: 10.1109/IRMMW-THz61557.2025.11319659

Reliability test program for submillimeter-wave low-noise amplifiers

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