Reply to comment on “Penetration of corrosive species into copper exposed to simulated O2-free groundwater by time-of-flight secondary ion mass spectrometry (ToF-SIMS)”

Jinshan Pan* (Corresponding Author), Xiaoqi Yue, Per Malmberg, Elisa Isotahdon, Vilma Ratia-Hanby, Elina Huttunen-Saarivirta, Christofer Leygraf

*Corresponding author for this work

Research output: Contribution to journalArticleScientific

Original languageEnglish
Article number111137
JournalCorrosion Science
Volume217
DOIs
Publication statusPublished - Jun 2023
MoE publication typeB1 Article in a scientific magazine

Keywords

  • Copper
  • Hydrogen embrittlement
  • Nano-SIMS
  • Nuclear waste disposal
  • Sulphur-induced corrosion
  • ToF-SIMS

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