Reply to comment on “Penetration of corrosive species into copper exposed to simulated O2-free groundwater by time-of-flight secondary ion mass spectrometry (ToF-SIMS)”

Jinshan Pan; Xiaoqi Yue; Per Malmberg; Elisa Isotahdon; Vilma Ratia-Hanby; Elina Huttunen-Saarivirta; Christofer Leygraf

doi:10.1016/j.corsci.2023.111137

Reply to comment on “Penetration of corrosive species into copper exposed to simulated O₂-free groundwater by time-of-flight secondary ion mass spectrometry (ToF-SIMS)”

Jinshan Pan^*
, Xiaoqi Yue
, Per Malmberg
, Elisa Isotahdon
, Vilma Ratia-Hanby
, Elina Huttunen-Saarivirta
, Christofer Leygraf

^*Corresponding author for this work

BA55 Knowledge driven design

KTH Royal Institute of Technology
Chalmers University of Technology

Research output: Contribution to journal › Article › Scientific

1 Citation (Scopus)

Original language	English
Article number	111137
Journal	Corrosion Science
Volume	217
DOIs	https://doi.org/10.1016/j.corsci.2023.111137
Publication status	Published - Jun 2023
MoE publication type	B1 Article in a scientific magazine

Funding

The financial supports from NKS (Contract AFT/NKS-R(19)127/2 ) and Swedish Research Council (Vetenskapsrådet, project no. 2021-04157 ) are greatly acknowledged.

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 12 Responsible Consumption and Production

Keywords

Copper
Hydrogen embrittlement
Nano-SIMS
Nuclear waste disposal
Sulphur-induced corrosion
ToF-SIMS

Access to Document

10.1016/j.corsci.2023.111137

Cite this

@article{df4a7957717545d4a5e83f2d88b062aa,

title = "Reply to comment on “Penetration of corrosive species into copper exposed to simulated O2-free groundwater by time-of-flight secondary ion mass spectrometry (ToF-SIMS)”",

keywords = "Copper, Hydrogen embrittlement, Nano-SIMS, Nuclear waste disposal, Sulphur-induced corrosion, ToF-SIMS",

author = "Jinshan Pan and Xiaoqi Yue and Per Malmberg and Elisa Isotahdon and Vilma Ratia-Hanby and Elina Huttunen-Saarivirta and Christofer Leygraf",

year = "2023",

month = jun,

doi = "10.1016/j.corsci.2023.111137",

language = "English",

volume = "217",

journal = "Corrosion Science",

issn = "0010-938X",

publisher = "Elsevier",

}

TY - JOUR

T1 - Reply to comment on “Penetration of corrosive species into copper exposed to simulated O2-free groundwater by time-of-flight secondary ion mass spectrometry (ToF-SIMS)”

AU - Pan, Jinshan

AU - Yue, Xiaoqi

AU - Malmberg, Per

AU - Isotahdon, Elisa

AU - Ratia-Hanby, Vilma

AU - Huttunen-Saarivirta, Elina

AU - Leygraf, Christofer

PY - 2023/6

Y1 - 2023/6

KW - Copper

KW - Hydrogen embrittlement

KW - Nano-SIMS

KW - Nuclear waste disposal

KW - Sulphur-induced corrosion

KW - ToF-SIMS

UR - https://www.scopus.com/pages/publications/85151452206

U2 - 10.1016/j.corsci.2023.111137

DO - 10.1016/j.corsci.2023.111137

M3 - Article

AN - SCOPUS:85151452206

SN - 0010-938X

VL - 217

JO - Corrosion Science

JF - Corrosion Science

M1 - 111137

ER -

Reply to comment on “Penetration of corrosive species into copper exposed to simulated O2-free groundwater by time-of-flight secondary ion mass spectrometry (ToF-SIMS)”

Funding

UN SDGs

Keywords

Access to Document

Other files and links

Research output

Penetration of corrosive species into copper exposed to simulated O2-free groundwater by time-of-flight secondary ion mass spectrometry (ToF-SIMS)

Cite this

Reply to comment on “Penetration of corrosive species into copper exposed to simulated O₂-free groundwater by time-of-flight secondary ion mass spectrometry (ToF-SIMS)”

Penetration of corrosive species into copper exposed to simulated O₂-free groundwater by time-of-flight secondary ion mass spectrometry (ToF-SIMS)