Results of proton irradiations of large area strip detectors made on high-resistivity Czochralski silicon

P. Luukka (Corresponding Author), J. Härkönen, E. Tuovinen, Eija Tuominen, K. Lassila-Perini, P. Mehtälä, S. Nummela, J. Nysten, D. Ungaro, A. Zibellini, P. Laitinen, I. Riihimäki, A. Virtanen, A. Furgeri, F. Hartmann

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Abstract

We have processed full-size strip detectors on Czochralski grown silicon wafers with resistivity of about 1.2 kΩ cm. Wafers grown with Czochralski method intrinsically contain high concentrations of oxygen, and thus have potential for high radiation tolerance. Detectors and test diodes were irradiated with 10 MeV protons. The 1-MeV neutron equivalent irradiation doses were 1.6×1014 and 8.5×1013 cm−2 for detectors, and up to 5.0×1014 cm−3 for test diodes. After irradiations, depletion voltages and leakage currents were measured. Czochralski silicon devices proved to be significantly more radiation hard than the reference devices made on traditional detector materials.

Original languageEnglish
Pages (from-to)117-121
JournalNuclear Instruments and Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume530
Issue number1-2
DOIs
Publication statusPublished - 2004
MoE publication typeA1 Journal article-refereed

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