Keyphrases
Strip Detector
100%
High Resistivity
100%
Czochralski Silicon
100%
Proton Irradiation
100%
Diode
66%
High Concentration
33%
Irradiation
33%
Oxygen Concentration
33%
Resistivity
33%
Neutron
33%
Silicon Wafer
33%
Radiation Hardness
33%
Wafer
33%
Reference Instrument
33%
Leakage Current
33%
Full-size
33%
Radiation Dose
33%
Silicon Devices
33%
Radiation Tolerance
33%
High Radiation
33%
Depletion Voltage
33%
Detector Materials
33%
Czochralski Method
33%
MeV Protons
33%
Voltage-current
33%
INIS
silicon
100%
irradiation
100%
protons
100%
devices
66%
radiations
66%
MeV range
66%
concentration
33%
tolerance
33%
size
33%
voltage
33%
oxygen
33%
neutrons
33%
radiation doses
33%
leakage current
33%
czochralski method
33%
Material Science
Electrical Resistivity
100%
Silicon
100%
Proton Irradiation
100%
Silicon Wafer
50%
Silicon Device
50%