Risks of damage to electronics with reference to charged clothing
- Jaakko Paasi*
- , L. Fast
- , Tapio Kalliohaka
- , J. Smallwood
- , A. Börjesson
- , J. Haase
- , C. Vogel
- , P. Lemaire
- , G. Coletti
- , F. Guastavino
- , T. Peltoniemi
- , G. Reina
*Corresponding author for this work
- Celestica Italia
- RISE Research Institutes of Sweden
- Electrostatic Solutions Ltd
- Agb-konsult
- Sächsisches Textilforschungsinstitut eV
- Centexbel
- University of Genoa (UniGe)
- Nokia Oyj
Research output: Contribution to journal › Article › Scientific › peer-review
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(Scopus)