Robustness and reliability of MOEMS for miniature spectrometers

Anna Rissanen, M. Broas, J. Hokka, T. Mattila, Jarkko Antila, Mari Laamanen, Heikki Saari

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    3 Citations (Scopus)

    Abstract

    Tunable MOEMS Fabry-Perot interferometers (FPIs) are key elements in the miniaturization of spectroscopic instrumentation. Robustness and high reliability of the MOEMS structure are important factors especially for sensors utilized in challenging environments such as in space- and automotive applications. This paper presents reliability assessment of two types of MOEMS optical filters; a tunable ALD (atomic layer deposition) -based surface micromachined FPI for visible - near-infrared range, and a tunable FPI for mid- infrared applications based on LPCVD (low-pressure chemical vapor deposition) thin-film micromachining. High-G shock tests were performed on both MOEMS FPIs. The FPI structures can survive mechanical impact up to 18 000 G without any detectable changes in the capacitance, while detected failure mechanisms in this range arise from packaging and not from the MOEMS structures. The effect of DDMS SAM (dichlorodimethylsilane self-assembled monolayer) coating to prevent in-use stiction was evaluated in both humidity- and impact tests. In humidity tests, 20% stiction rate in non-coated devices vs. 0% stiction rate in DDMS-coated LPCVD FPIs under pull-in was observed. These results indicate good shock-impact robustness for both types of surface-micromachined structures, while DDMS SAM can be utilized to improve in-use reliability of MOEMS.
    Original languageEnglish
    Title of host publicationReliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII
    EditorsRajeshuni Ramesham, Herbert R. Shea
    PublisherInternational Society for Optics and Photonics SPIE
    ISBN (Print)978-081949383-5
    DOIs
    Publication statusPublished - 2013
    MoE publication typeNot Eligible
    EventSPIE MOEMS-MEMS - San Francisco, CA, United States
    Duration: 2 Feb 20137 Feb 2013

    Publication series

    SeriesProceedings of SPIE
    Volume8614
    ISSN0277-786X

    Conference

    ConferenceSPIE MOEMS-MEMS
    CountryUnited States
    CitySan Francisco, CA
    Period2/02/137/02/13

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    Keywords

    • Fabry-Perot interferometer
    • miniature spectrometers
    • MOEMS
    • nanosatellite

    Cite this

    Rissanen, A., Broas, M., Hokka, J., Mattila, T., Antila, J., Laamanen, M., & Saari, H. (2013). Robustness and reliability of MOEMS for miniature spectrometers. In R. Ramesham, & H. R. Shea (Eds.), Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII [861409] International Society for Optics and Photonics SPIE. Proceedings of SPIE, Vol.. 8614 https://doi.org/10.1117/12.2000495