Rugged fiber-optic raman probe for process monitoring applications

Pentti Niemelä (Corresponding Author), Janne Suhonen

Research output: Contribution to journalArticleScientificpeer-review

23 Citations (Scopus)

Abstract

We report on the development of a simple, rugged fiber-optic probe for process Raman measurements, in which laser line rejection is based on an absorptive longpass filter made from a direct bandgap CdTe semiconductor. The probe can be used with a fixed wavelength laser at 830 nm, and Raman spectra can be recorded down to 200 cm−1 from the laser line. The filter thickness can be adjusted for final turning of the filter edge, as the edge slope is almost independent of thickness in the range 0.1 to 1 mm. Other properties of the probe, such as its signal-to-noise ratio and signal-to-background ratio, are shown to compare well with those of a state-of-the-art probe based on holographic notch filter techniques.
Original languageEnglish
Pages (from-to)1337-1340
Number of pages4
JournalApplied Spectroscopy
Volume55
Issue number10
DOIs
Publication statusPublished - 2001
MoE publication typeA1 Journal article-refereed

Fingerprint

Process monitoring
Fiber optics
fiber optics
filters
probes
Lasers
lasers
Notch filters
notches
rejection
Raman scattering
Signal to noise ratio
Energy gap
signal to noise ratios
Raman spectra
Semiconductor materials
slopes
Wavelength
wavelengths

Cite this

Niemelä, Pentti ; Suhonen, Janne. / Rugged fiber-optic raman probe for process monitoring applications. In: Applied Spectroscopy. 2001 ; Vol. 55, No. 10. pp. 1337-1340.
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Rugged fiber-optic raman probe for process monitoring applications. / Niemelä, Pentti (Corresponding Author); Suhonen, Janne.

In: Applied Spectroscopy, Vol. 55, No. 10, 2001, p. 1337-1340.

Research output: Contribution to journalArticleScientificpeer-review

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AU - Suhonen, Janne

PY - 2001

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AB - We report on the development of a simple, rugged fiber-optic probe for process Raman measurements, in which laser line rejection is based on an absorptive longpass filter made from a direct bandgap CdTe semiconductor. The probe can be used with a fixed wavelength laser at 830 nm, and Raman spectra can be recorded down to 200 cm−1 from the laser line. The filter thickness can be adjusted for final turning of the filter edge, as the edge slope is almost independent of thickness in the range 0.1 to 1 mm. Other properties of the probe, such as its signal-to-noise ratio and signal-to-background ratio, are shown to compare well with those of a state-of-the-art probe based on holographic notch filter techniques.

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DO - 10.1366/0003702011953694

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