Rugged probe design delivers MIC measurements

Research output: Contribution to journalArticleScientificpeer-review

Abstract

While microwave probes are key components in test laboratories or production lines, their availability has been primarily limited to measurements of monolithic microwave integrated circuits (MMICs). Due to their delicate structure, these probes must be operated with the help of an expensive micrometer positioner. A rugged coplanar-stripline probe has been developed that-overcomes the need for a micrometer positioner while providing measurement of hybrid MICs at frequencies up to 10 GHz.
Original languageEnglish
Article number104, 106, 109
JournalMicrowaves and RF
Volume35
Issue number6
Publication statusPublished - 1996
MoE publication typeA1 Journal article-refereed

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Monolithic microwave integrated circuits
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title = "Rugged probe design delivers MIC measurements",
abstract = "While microwave probes are key components in test laboratories or production lines, their availability has been primarily limited to measurements of monolithic microwave integrated circuits (MMICs). Due to their delicate structure, these probes must be operated with the help of an expensive micrometer positioner. A rugged coplanar-stripline probe has been developed that-overcomes the need for a micrometer positioner while providing measurement of hybrid MICs at frequencies up to 10 GHz.",
author = "Markku Jenu",
year = "1996",
language = "English",
volume = "35",
journal = "Microwaves and RF",
issn = "0745-2993",
publisher = "Penton Publishing Co.",
number = "6",

}

Rugged probe design delivers MIC measurements. / Jenu, Markku.

In: Microwaves and RF, Vol. 35, No. 6, 104, 106, 109, 1996.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - Rugged probe design delivers MIC measurements

AU - Jenu, Markku

PY - 1996

Y1 - 1996

N2 - While microwave probes are key components in test laboratories or production lines, their availability has been primarily limited to measurements of monolithic microwave integrated circuits (MMICs). Due to their delicate structure, these probes must be operated with the help of an expensive micrometer positioner. A rugged coplanar-stripline probe has been developed that-overcomes the need for a micrometer positioner while providing measurement of hybrid MICs at frequencies up to 10 GHz.

AB - While microwave probes are key components in test laboratories or production lines, their availability has been primarily limited to measurements of monolithic microwave integrated circuits (MMICs). Due to their delicate structure, these probes must be operated with the help of an expensive micrometer positioner. A rugged coplanar-stripline probe has been developed that-overcomes the need for a micrometer positioner while providing measurement of hybrid MICs at frequencies up to 10 GHz.

M3 - Article

VL - 35

JO - Microwaves and RF

JF - Microwaves and RF

SN - 0745-2993

IS - 6

M1 - 104, 106, 109

ER -