Abstract
While microwave probes are key components in test laboratories or production lines, their availability has been primarily limited to measurements of monolithic microwave integrated circuits (MMICs). Due to their delicate structure, these probes must be operated with the help of an expensive micrometer positioner. A rugged coplanar-stripline probe has been developed that-overcomes the need for a micrometer positioner while providing measurement of hybrid MICs at frequencies up to 10 GHz.
| Original language | English |
|---|---|
| Article number | 104, 106, 109 |
| Journal | Microwaves and RF |
| Volume | 35 |
| Issue number | 6 |
| Publication status | Published - 1996 |
| MoE publication type | A1 Journal article-refereed |