Sample probe

Vili Kellokumpu; Jussi Tenhunen; Hannu Vasama; Douglas Craig; Dave McKeown

Sample probe

Vili Kellokumpu (Inventor)
, Jussi Tenhunen (Inventor)
, Hannu Vasama (Inventor)
, Douglas Craig (Inventor)
, Dave McKeown (Inventor)

BA6301 Optical measurements

Research output: Patent › Patent

Abstract

According to an example aspect of the present invention, there is provided a probe device comprising a sample conveyor tube connectable with a source of pressurized gas, a probe head connected with the sample conveyor tube, the probe head comprising a sampling mechanism configured to obtain a sample of granular material surrounding the probe head, and the sampling mechanism being configured to provide the sample to the sample conveyor tube, and the probe device being configured to employ pressurized gas from the source of pressurized gas to propel the sample from the probe head via the sample conveyor tube.

Patent family as of 14.7.2026
EP4710084 A1, FI132007 B, FI20235529 A, WO24231597 A1

Original language	English
Patent number	FI132007 B1
IPC	C08G63/183
Priority date	10/05/23
Filing date	10/05/23
Publication status	Published - 10 Apr 2026
MoE publication type	H1 Granted patent

Cite this

@misc{10fde8993ab94f0aa725250f1489368d,

title = "Sample probe",

abstract = "According to an example aspect of the present invention, there is provided a probe device comprising a sample conveyor tube connectable with a source of pressurized gas, a probe head connected with the sample conveyor tube, the probe head comprising a sampling mechanism configured to obtain a sample of granular material surrounding the probe head, and the sampling mechanism being configured to provide the sample to the sample conveyor tube, and the probe device being configured to employ pressurized gas from the source of pressurized gas to propel the sample from the probe head via the sample conveyor tube. Patent family as of 14.7.2026 EP4710084 A1, FI132007 B, FI20235529 A, WO24231597 A1",

author = "Vili Kellokumpu and Jussi Tenhunen and Hannu Vasama and Douglas Craig and Dave McKeown",

year = "2026",

month = apr,

day = "10",

language = "English",

type = "Patent",

note = "FI132007 B1; C08G63/183",

}

TY - PAT

T1 - Sample probe

AU - Kellokumpu, Vili

AU - Tenhunen, Jussi

AU - Vasama, Hannu

AU - Craig, Douglas

AU - McKeown, Dave

PY - 2026/4/10

Y1 - 2026/4/10

N2 - According to an example aspect of the present invention, there is provided a probe device comprising a sample conveyor tube connectable with a source of pressurized gas, a probe head connected with the sample conveyor tube, the probe head comprising a sampling mechanism configured to obtain a sample of granular material surrounding the probe head, and the sampling mechanism being configured to provide the sample to the sample conveyor tube, and the probe device being configured to employ pressurized gas from the source of pressurized gas to propel the sample from the probe head via the sample conveyor tube. Patent family as of 14.7.2026 EP4710084 A1, FI132007 B, FI20235529 A, WO24231597 A1

AB - According to an example aspect of the present invention, there is provided a probe device comprising a sample conveyor tube connectable with a source of pressurized gas, a probe head connected with the sample conveyor tube, the probe head comprising a sampling mechanism configured to obtain a sample of granular material surrounding the probe head, and the sampling mechanism being configured to provide the sample to the sample conveyor tube, and the probe device being configured to employ pressurized gas from the source of pressurized gas to propel the sample from the probe head via the sample conveyor tube. Patent family as of 14.7.2026 EP4710084 A1, FI132007 B, FI20235529 A, WO24231597 A1

UR - https://fi.espacenet.com/publicationDetails/biblio?II=0&ND=3&adjacent=true&locale=fi_FI&FT=D&date=20241114&CC=WO&NR=2024231597A1&KC=A1

M3 - Patent

M1 - FI132007 B1

Y2 - 2023/05/10

ER -

Sample probe

Abstract

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