Scalable methods of discrete plant model generation for closed-loop model checking

Igor Buzhinsky, Antti Pakonen, Valeriy Vyatkin

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

Abstract

To facilitate correctness and safety of mission-critical automation systems, formal methods should be applied in addition to simulation and testing. One of such formal methods is model checking, which is capable of verifying complex requirements for the system's model. If both the controller and the controlled plant are formally modeled, then the variant of this technique called closed-loop model checking can be applied. Recently, a technique of automatic plant model generation has been proposed which is applicable in this scenario. This paper continues the work in this direction by presenting two plant model construction approaches which are much more scalable with respect to the previous one, and puts this work into a more practical context. The approaches are evaluated on a case study from the nuclear automation domain.
Original languageEnglish
Title of host publicationProceedings IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society
PublisherIEEE Institute of Electrical and Electronic Engineers
Pages5483-5488
Number of pages6
ISBN (Electronic)9781538611272
DOIs
Publication statusPublished - 15 Dec 2017
MoE publication typeA4 Article in a conference publication
Event43rd Annual Conference of the IEEE Industrial Electronics Society, IECON 2017 - Beijing, China
Duration: 29 Oct 20171 Nov 2017
Conference number: 43

Conference

Conference43rd Annual Conference of the IEEE Industrial Electronics Society, IECON 2017
Abbreviated titleIECON 2017
CountryChina
CityBeijing
Period29/10/171/11/17

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  • Cite this

    Buzhinsky, I., Pakonen, A., & Vyatkin, V. (2017). Scalable methods of discrete plant model generation for closed-loop model checking. In Proceedings IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society (pp. 5483-5488). IEEE Institute of Electrical and Electronic Engineers. https://doi.org/10.1109/IECON.2017.8216949