@inproceedings{cca5c27dff5c4e199fcabb03ced15ba6,
title = "Scanning white light interferometry for optical scanner calibration using gem-foil based traceable standard",
abstract = "Gas Electron Multiplier (GEM) detectors record particle trajectories in colliders. GEM characterization is important during manufacturing and final testing. We established a traceable method to calibrate our Optical Scanning System employed for quality control of GEM foils.",
author = "A. Karadzhinova and A. Nolvi and T. Hild{\'e}n and R. Lauhakangas and E. H{\ae}ggstr{\"o}m and E. Tuominen and Ivan Kassamakov",
year = "2014",
month = oct,
day = "14",
doi = "10.1364/fio.2014.fw5a.2",
language = "English",
series = "OSA Technical Digest",
publisher = "Optical Society of America OSA",
booktitle = "Frontiers in Optics 2014",
address = "United States",
}