Scanning white light interferometry for optical scanner calibration using gem-foil based traceable standard

A. Karadzhinova; A. Nolvi; T. Hildén; R. Lauhakangas; E. Hæggström; E. Tuominen; Ivan Kassamakov

doi:10.1364/fio.2014.fw5a.2

Scanning white light interferometry for optical scanner calibration using gem-foil based traceable standard

A. Karadzhinova^*
, A. Nolvi
, T. Hildén
, R. Lauhakangas
, E. Hæggström
, E. Tuominen
, Ivan Kassamakov

^*Corresponding author for this work

Not published at VTT

University of Helsinki

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

Abstract

Gas Electron Multiplier (GEM) detectors record particle trajectories in colliders. GEM characterization is important during manufacturing and final testing. We established a traceable method to calibrate our Optical Scanning System employed for quality control of GEM foils.

Original language	English
Title of host publication	Frontiers in Optics 2014
Publisher	Optica Publishing Group
ISBN (Electronic)	1-55752-286-3
DOIs	https://doi.org/10.1364/fio.2014.fw5a.2
Publication status	Published - 14 Oct 2014
MoE publication type	A4 Article in a conference publication

Publication series

Series	OSA Technical Digest

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 9 Industry, Innovation, and Infrastructure

Access to Document

10.1364/fio.2014.fw5a.2

Cite this

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title = "Scanning white light interferometry for optical scanner calibration using gem-foil based traceable standard",

abstract = "Gas Electron Multiplier (GEM) detectors record particle trajectories in colliders. GEM characterization is important during manufacturing and final testing. We established a traceable method to calibrate our Optical Scanning System employed for quality control of GEM foils.",

author = "A. Karadzhinova and A. Nolvi and T. Hild{\'e}n and R. Lauhakangas and E. H{\ae}ggstr{\"o}m and E. Tuominen and Ivan Kassamakov",

year = "2014",

month = oct,

day = "14",

doi = "10.1364/fio.2014.fw5a.2",

language = "English",

series = "OSA Technical Digest",

publisher = "Optica Publishing Group",

booktitle = "Frontiers in Optics 2014",

address = "United States",

}

Scanning white light interferometry for optical scanner calibration using gem-foil based traceable standard. / Karadzhinova, A.; Nolvi, A.; Hildén, T. et al.
Frontiers in Optics 2014. Optica Publishing Group, 2014. FW5A.2 (OSA Technical Digest).

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

TY - GEN

T1 - Scanning white light interferometry for optical scanner calibration using gem-foil based traceable standard

AU - Karadzhinova, A.

AU - Nolvi, A.

AU - Hildén, T.

AU - Lauhakangas, R.

AU - Hæggström, E.

AU - Tuominen, E.

AU - Kassamakov, Ivan

PY - 2014/10/14

Y1 - 2014/10/14

N2 - Gas Electron Multiplier (GEM) detectors record particle trajectories in colliders. GEM characterization is important during manufacturing and final testing. We established a traceable method to calibrate our Optical Scanning System employed for quality control of GEM foils.

AB - Gas Electron Multiplier (GEM) detectors record particle trajectories in colliders. GEM characterization is important during manufacturing and final testing. We established a traceable method to calibrate our Optical Scanning System employed for quality control of GEM foils.

UR - https://www.scopus.com/pages/publications/85088744030

U2 - 10.1364/fio.2014.fw5a.2

DO - 10.1364/fio.2014.fw5a.2

M3 - Conference article in proceedings

AN - SCOPUS:85088744030

T3 - OSA Technical Digest

BT - Frontiers in Optics 2014

PB - Optica Publishing Group

ER -

Scanning white light interferometry for optical scanner calibration using gem-foil based traceable standard

Abstract

Publication series

UN SDGs

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