Scanning X-ray spectrometer for high-resolution Compton profile measurements at ESRF

P. Suortti (Corresponding Author), T. Buslaps, P. Fajardo, V. Honkimäki, M. Kretzschmer, U. Lienert, J. McCarthy, M. Renier, A. Shukla, Th. Tschentscher, Tor Meinander

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Abstract

A scanning-type crystal spectrometer for high-resolution Compton profile measurements has been constructed at the High Energy Inelastic Scattering Beamline (ID15B) of the ESRF. Radiation from a seven-period asymmetrical permanent-magnet wiggler or from a superconducting wavelength shifter is focused horizontally onto the sample by a bent-crystal monochromator. Typical energies are 30, 50 and 60 keV, the flux on the sample is 1012 photons s−1, and the relative energy bandwidth is 3 × 10−4. The spectrometer operates in the Rowland circle geometry, where the sample is fixed and the cylindrically bent analyser crystal and the detector move on the focusing circle by synchronized translations and rotations. The main detector is a large-diameter NaI scintillation counter, the incident beam is monitored by an Si diode, and scattering from the sample is detected using a Ge detector. The recorded spectrum is corrected for the energy-dependent response of the spectrometer, background and multiple scattering, and converted to the momentum scale. The resolution of the spectrometer is calculated from the geometrical factors and the reflectivity curve of the analyser crystal, and the result is checked against the widths of the elastically scattered line and fluorescent lines. So far, 0.1 a.u. resolution in electron momentum has been achieved. The typical average count rate over the Compton profile is about 1000 counts s−1 from a weakly absorbing sample.
Original languageEnglish
Pages (from-to)69-80
Number of pages12
JournalJournal of Synchrotron Radiation
Volume6
Issue number2
DOIs
Publication statusPublished - 1999
MoE publication typeA1 Journal article-refereed

Fingerprint

X ray spectrometers
Spectrometers
spectrometers
Scanning
Crystals
scanning
high resolution
profiles
Detectors
Momentum
x rays
crystals
detectors
Scintillation counters
Inelastic scattering
Rowland circles
Monochromators
Multiple scattering
momentum
energy

Keywords

  • Compton scatterings
  • X-ray spectrometers

Cite this

Suortti, P., Buslaps, T., Fajardo, P., Honkimäki, V., Kretzschmer, M., Lienert, U., ... Meinander, T. (1999). Scanning X-ray spectrometer for high-resolution Compton profile measurements at ESRF. Journal of Synchrotron Radiation, 6(2), 69-80. https://doi.org/10.1107/S0909049599000291
Suortti, P. ; Buslaps, T. ; Fajardo, P. ; Honkimäki, V. ; Kretzschmer, M. ; Lienert, U. ; McCarthy, J. ; Renier, M. ; Shukla, A. ; Tschentscher, Th. ; Meinander, Tor. / Scanning X-ray spectrometer for high-resolution Compton profile measurements at ESRF. In: Journal of Synchrotron Radiation. 1999 ; Vol. 6, No. 2. pp. 69-80.
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Suortti, P, Buslaps, T, Fajardo, P, Honkimäki, V, Kretzschmer, M, Lienert, U, McCarthy, J, Renier, M, Shukla, A, Tschentscher, T & Meinander, T 1999, 'Scanning X-ray spectrometer for high-resolution Compton profile measurements at ESRF', Journal of Synchrotron Radiation, vol. 6, no. 2, pp. 69-80. https://doi.org/10.1107/S0909049599000291

Scanning X-ray spectrometer for high-resolution Compton profile measurements at ESRF. / Suortti, P. (Corresponding Author); Buslaps, T.; Fajardo, P.; Honkimäki, V.; Kretzschmer, M.; Lienert, U.; McCarthy, J.; Renier, M.; Shukla, A.; Tschentscher, Th.; Meinander, Tor.

In: Journal of Synchrotron Radiation, Vol. 6, No. 2, 1999, p. 69-80.

Research output: Contribution to journalArticleScientificpeer-review

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T1 - Scanning X-ray spectrometer for high-resolution Compton profile measurements at ESRF

AU - Suortti, P.

AU - Buslaps, T.

AU - Fajardo, P.

AU - Honkimäki, V.

AU - Kretzschmer, M.

AU - Lienert, U.

AU - McCarthy, J.

AU - Renier, M.

AU - Shukla, A.

AU - Tschentscher, Th.

AU - Meinander, Tor

PY - 1999

Y1 - 1999

N2 - A scanning-type crystal spectrometer for high-resolution Compton profile measurements has been constructed at the High Energy Inelastic Scattering Beamline (ID15B) of the ESRF. Radiation from a seven-period asymmetrical permanent-magnet wiggler or from a superconducting wavelength shifter is focused horizontally onto the sample by a bent-crystal monochromator. Typical energies are 30, 50 and 60 keV, the flux on the sample is 1012 photons s−1, and the relative energy bandwidth is 3 × 10−4. The spectrometer operates in the Rowland circle geometry, where the sample is fixed and the cylindrically bent analyser crystal and the detector move on the focusing circle by synchronized translations and rotations. The main detector is a large-diameter NaI scintillation counter, the incident beam is monitored by an Si diode, and scattering from the sample is detected using a Ge detector. The recorded spectrum is corrected for the energy-dependent response of the spectrometer, background and multiple scattering, and converted to the momentum scale. The resolution of the spectrometer is calculated from the geometrical factors and the reflectivity curve of the analyser crystal, and the result is checked against the widths of the elastically scattered line and fluorescent lines. So far, 0.1 a.u. resolution in electron momentum has been achieved. The typical average count rate over the Compton profile is about 1000 counts s−1 from a weakly absorbing sample.

AB - A scanning-type crystal spectrometer for high-resolution Compton profile measurements has been constructed at the High Energy Inelastic Scattering Beamline (ID15B) of the ESRF. Radiation from a seven-period asymmetrical permanent-magnet wiggler or from a superconducting wavelength shifter is focused horizontally onto the sample by a bent-crystal monochromator. Typical energies are 30, 50 and 60 keV, the flux on the sample is 1012 photons s−1, and the relative energy bandwidth is 3 × 10−4. The spectrometer operates in the Rowland circle geometry, where the sample is fixed and the cylindrically bent analyser crystal and the detector move on the focusing circle by synchronized translations and rotations. The main detector is a large-diameter NaI scintillation counter, the incident beam is monitored by an Si diode, and scattering from the sample is detected using a Ge detector. The recorded spectrum is corrected for the energy-dependent response of the spectrometer, background and multiple scattering, and converted to the momentum scale. The resolution of the spectrometer is calculated from the geometrical factors and the reflectivity curve of the analyser crystal, and the result is checked against the widths of the elastically scattered line and fluorescent lines. So far, 0.1 a.u. resolution in electron momentum has been achieved. The typical average count rate over the Compton profile is about 1000 counts s−1 from a weakly absorbing sample.

KW - Compton scatterings

KW - X-ray spectrometers

U2 - 10.1107/S0909049599000291

DO - 10.1107/S0909049599000291

M3 - Article

VL - 6

SP - 69

EP - 80

JO - Journal of Synchrotron Radiation

JF - Journal of Synchrotron Radiation

SN - 0909-0495

IS - 2

ER -