Scanning X-ray spectrometer for high-resolution Compton profile measurements at ESRF

P. Suortti*, T. Buslaps, P. Fajardo, V. Honkimäki, M. Kretzschmer, U. Lienert, J. McCarthy, M. Renier, A. Shukla, Th. Tschentscher, Tor Meinander

*Corresponding author for this work

Research output: Contribution to journal › Article › Scientific › peer-review

67 Citations (Scopus)

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Physics