Scattering in paper coatings

Timo Hyvärinen, Juha Sumen

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review


Paper coatings are porous structures of pigments, binder and air. This research aims at developing a model for the prediction of the bulk optical properties of coating from its structure and material characteristics. Two theoretical approaches have been studied and compared. In both cases the coating is treated as a structured layer consisting of individual scatterers in a medium, and the pores are regarded as scatters. In the first approach they are assumed to be independent. The second approach takes into account that due to their close position the pores are in fact correlated scatterers. The approximation used limits the consideration to pair correlation only. Comparison of the theories to reflectance measurements on polystyrene pigment coatings have uniform pore sizes in the range from 0.13 to 0.95 micrometers showed that for pore size parameters less than 5 the dependent scattering model provides a good prediction for the reflectance, but for larger pore size parameters the reflection behavior approaches that predicted by the independent scattering theory.
Original languageEnglish
Title of host publicationOptical Scatter
Subtitle of host publicationApplications, Measurement, and Theory
EditorsJohn C. Stover
Place of PublicationBellingham
PublisherInternational Society for Optics and Photonics SPIE
ISBN (Print)978-0-8194-0658-3
Publication statusPublished - 1991
MoE publication typeA4 Article in a conference publication
EventSymposium on Optical Applied Science and Engineering - San Diego, United States
Duration: 21 Jul 199126 Jul 1991


ConferenceSymposium on Optical Applied Science and Engineering
Abbreviated titleSan Diego '91
CountryUnited States
CitySan Diego

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    Hyvärinen, T., & Sumen, J. (1991). Scattering in paper coatings. In J. C. Stover (Ed.), Optical Scatter: Applications, Measurement, and Theory (pp. 325-334). International Society for Optics and Photonics SPIE.