Searching for the best test

Tanja Vos, Pekka Aho

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    1 Citation (Scopus)

    Abstract

    Random testing has been controversial throughout the history. In the early 70s opinions about random testing were divided: Girard and Rault (1973) call it a valuable test case generation scheme [11]. This is confirmed by Thayer, Lipow and Nelson (1978) in their book on software reliability [21] they say it is the necessary final step in the testing activities. However, Glenford Myers (1979) in his seminal work on the art of Software Testing [18] denominates random testing as probably the poorest testing method.
    Original languageEnglish
    Title of host publicationProceedings - 2017 IEEE/ACM 10th International Workshop on Search-Based Software Testing, SBST 2017
    PublisherInstitute of Electrical and Electronic Engineers IEEE
    Pages3-4
    Number of pages2
    ISBN (Electronic)978-1-5386-2789-1
    ISBN (Print)978-1-5386-2790-7
    DOIs
    Publication statusPublished - 3 Jul 2017
    MoE publication typeA4 Article in a conference publication
    EventIEEE/ACM 10th International Workshop on Search-Based Software Testing, SBST 2017 - Buenos Aires, Argentina
    Duration: 22 May 201723 May 2017

    Conference

    ConferenceIEEE/ACM 10th International Workshop on Search-Based Software Testing, SBST 2017
    Abbreviated titleSBST 2017
    CountryArgentina
    CityBuenos Aires
    Period22/05/1723/05/17

    Fingerprint

    Testing
    Software reliability
    Software testing

    Keywords

    • graphical user interface testing
    • machine learning
    • random testing
    • search-based testing
    • software test automation

    Cite this

    Vos, T., & Aho, P. (2017). Searching for the best test. In Proceedings - 2017 IEEE/ACM 10th International Workshop on Search-Based Software Testing, SBST 2017 (pp. 3-4). [7967912] Institute of Electrical and Electronic Engineers IEEE. https://doi.org/10.1109/SBST.2017.11
    Vos, Tanja ; Aho, Pekka. / Searching for the best test. Proceedings - 2017 IEEE/ACM 10th International Workshop on Search-Based Software Testing, SBST 2017. Institute of Electrical and Electronic Engineers IEEE, 2017. pp. 3-4
    @inproceedings{5c6b73d398984db58a06e9b74d6d44fb,
    title = "Searching for the best test",
    abstract = "Random testing has been controversial throughout the history. In the early 70s opinions about random testing were divided: Girard and Rault (1973) call it a valuable test case generation scheme [11]. This is confirmed by Thayer, Lipow and Nelson (1978) in their book on software reliability [21] they say it is the necessary final step in the testing activities. However, Glenford Myers (1979) in his seminal work on the art of Software Testing [18] denominates random testing as probably the poorest testing method.",
    keywords = "graphical user interface testing, machine learning, random testing, search-based testing, software test automation",
    author = "Tanja Vos and Pekka Aho",
    year = "2017",
    month = "7",
    day = "3",
    doi = "10.1109/SBST.2017.11",
    language = "English",
    isbn = "978-1-5386-2790-7",
    pages = "3--4",
    booktitle = "Proceedings - 2017 IEEE/ACM 10th International Workshop on Search-Based Software Testing, SBST 2017",
    publisher = "Institute of Electrical and Electronic Engineers IEEE",
    address = "United States",

    }

    Vos, T & Aho, P 2017, Searching for the best test. in Proceedings - 2017 IEEE/ACM 10th International Workshop on Search-Based Software Testing, SBST 2017., 7967912, Institute of Electrical and Electronic Engineers IEEE, pp. 3-4, IEEE/ACM 10th International Workshop on Search-Based Software Testing, SBST 2017, Buenos Aires, Argentina, 22/05/17. https://doi.org/10.1109/SBST.2017.11

    Searching for the best test. / Vos, Tanja; Aho, Pekka.

    Proceedings - 2017 IEEE/ACM 10th International Workshop on Search-Based Software Testing, SBST 2017. Institute of Electrical and Electronic Engineers IEEE, 2017. p. 3-4 7967912.

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    TY - GEN

    T1 - Searching for the best test

    AU - Vos, Tanja

    AU - Aho, Pekka

    PY - 2017/7/3

    Y1 - 2017/7/3

    N2 - Random testing has been controversial throughout the history. In the early 70s opinions about random testing were divided: Girard and Rault (1973) call it a valuable test case generation scheme [11]. This is confirmed by Thayer, Lipow and Nelson (1978) in their book on software reliability [21] they say it is the necessary final step in the testing activities. However, Glenford Myers (1979) in his seminal work on the art of Software Testing [18] denominates random testing as probably the poorest testing method.

    AB - Random testing has been controversial throughout the history. In the early 70s opinions about random testing were divided: Girard and Rault (1973) call it a valuable test case generation scheme [11]. This is confirmed by Thayer, Lipow and Nelson (1978) in their book on software reliability [21] they say it is the necessary final step in the testing activities. However, Glenford Myers (1979) in his seminal work on the art of Software Testing [18] denominates random testing as probably the poorest testing method.

    KW - graphical user interface testing

    KW - machine learning

    KW - random testing

    KW - search-based testing

    KW - software test automation

    UR - http://www.scopus.com/inward/record.url?scp=85027444581&partnerID=8YFLogxK

    U2 - 10.1109/SBST.2017.11

    DO - 10.1109/SBST.2017.11

    M3 - Conference article in proceedings

    SN - 978-1-5386-2790-7

    SP - 3

    EP - 4

    BT - Proceedings - 2017 IEEE/ACM 10th International Workshop on Search-Based Software Testing, SBST 2017

    PB - Institute of Electrical and Electronic Engineers IEEE

    ER -

    Vos T, Aho P. Searching for the best test. In Proceedings - 2017 IEEE/ACM 10th International Workshop on Search-Based Software Testing, SBST 2017. Institute of Electrical and Electronic Engineers IEEE. 2017. p. 3-4. 7967912 https://doi.org/10.1109/SBST.2017.11