Sekundaari-ionimassaspektrometri (SIMS)

    Research output: Chapter in Book/Report/Conference proceedingChapter or book articleProfessional

    Original languageEnglish
    Title of host publicationMassaspektrometrian perusteet
    EditorsRaimo Ketola, Tapio Kotiaho, Risto Kostiainen, Pirjo Vainiotalo
    Place of PublicationKlaukkala
    Pages231-238
    Publication statusPublished - 2010
    MoE publication typeD2 Article in professional manuals or guides or professional information systems or text book material

    Cite this

    Likonen, J. (2010). Sekundaari-ionimassaspektrometri (SIMS). In R. Ketola, T. Kotiaho, R. Kostiainen, & P. Vainiotalo (Eds.), Massaspektrometrian perusteet (pp. 231-238).