Sekundaari-ionimassaspektrometri (SIMS)

    Research output: Chapter in Book/Report/Conference proceedingChapter or book articleProfessional

    Original languageEnglish
    Title of host publicationMassaspektrometrian perusteet
    EditorsRaimo Ketola, Tapio Kotiaho, Risto Kostiainen, Pirjo Vainiotalo
    Place of PublicationKlaukkala
    Pages231-238
    Publication statusPublished - 2010
    MoE publication typeD2 Article in professional manuals or guides or professional information systems or text book material

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