Selection of the silicon sensor thickness for the Phase-2 upgrade of the CMS Outer Tracker

Alexander Dierlamm*, Eija Tuominen, Tracker Group of the CMS Collaboration

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

7 Citations (Scopus)

Abstract

During the operation of the CMS experiment at the High-Luminosity LHC the silicon sensors of the Phase-2 Outer Tracker will be exposed to radiation levels that could potentially deteriorate their performance. Previous studies had determined that planar float zone silicon with n-doped strips on a p-doped substrate was preferred over p-doped strips on an n-doped substrate. The last step in evaluating the optimal design for the mass production of about 200 m² of silicon sensors was to compare sensors of baseline thickness (about 300 µm) to thinned sensors (about 240 µm), which promised several benefits at high radiation levels because of the higher electric fields at the same bias voltage. This study provides a direct comparison of these two thicknesses in terms of sensor characteristics as well as charge collection and hit efficiency for fluences up to 1.5 × 1015 neq/cm². The measurement results demonstrate that sensors with about 300 µm thickness will ensure excellent tracking performance even at the highest considered fluence levels expected for the Phase-2 Outer Tracker.

Original languageEnglish
Article numberP11028
JournalJournal of Instrumentation
Volume16
Issue number11
DOIs
Publication statusPublished - Nov 2021
MoE publication typeA1 Journal article-refereed

Keywords

  • Particle tracking detectors (Solid-state detectors)
  • Radiation damage to detector materials (solid state)
  • Radiation-hard detectors
  • Si microstrip and pad detectors

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