Abstract
We propose and demonstrate a method for self-aligning control of doping profiles in nanoscale silicon devices. The method is based on different segregation behaviour of n-type and p-type dopants during thermal oxidation. The simulations show that in nanowires with compensated impurity concentrations the type of conductivity can be changed from p-type to n-type. We use the method to realize a lateral field effect device in silicon showing pn-diode-like characteristics at 300 K.
Original language | English |
---|---|
Pages (from-to) | 547-549 |
Number of pages | 3 |
Journal | Physica E: Low-Dimensional Systems and Nanostructures |
Volume | 32 |
Issue number | 1-2 |
DOIs | |
Publication status | Published - 2006 |
MoE publication type | A1 Journal article-refereed |
Event | 12th International Conference on Modulated Semiconductor Structures, MSS12 - Albuquerque, United States Duration: 10 Jul 2005 → 15 Jul 2005 |
Keywords
- segregation
- semiconductor doping
- semiconductors
- diode
- silicon on insulator
- CMOS