Abstract
A strong need exists for an effective nanopatterning
technique to fabricate devices of the next generation at
low cost. Nanoimprint lithography (NIL) has recently
received considerable attention because of its process
simplicity. In particular, there are strong expectations
that thermal roll-to-roll NIL (T-R2RNIL) might be permit
high-throughput nanopatterning. In fabricating nanoscale
patterns by T-R2RNIL, it is important to understand the
transfer characteristics of the materials to permit the
prediction of properties of the fabricated pattern. We
previously reported the transfer characteristics of a
cellulose acetate (CA) film in T-R2RNIL, and we showed
that the height of the patterns obtained at temperatures
near the glass-transition temperature of the polymer (Tg)
was lower than that obtained at temperatures below the
Tg. Moreover, we found that the replication behavior of
nanoscale gratings differed from that of microscale
gratings. However, we did not examine the self-relaxation
behavior after T-R2RNIL. In this study, we investigated
changes deformation characteristics after a prolonged
development time for nano- and microspace patterns on CA
film. The self-relaxation behavior was shown to depend on
the process temperature for T-R2RNIL, as well as on the
features of the mold. In addition, a unique pattern whose
pattern density was almost double that of the original
mold was obtained by T-R2RNIL at a certain temperature.
Original language | English |
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Pages (from-to) | 83-87 |
Journal | Microelectronic Engineering |
Volume | 153 |
DOIs | |
Publication status | Published - 2016 |
MoE publication type | A1 Journal article-refereed |
Keywords
- nanostructures
- roll-to-roll
- nanoimprinting
- thermal nanoimprinting
- R2RNIL