Shot-noise-driven escape in hysteretic Josephson junctions

J.P. Pekola, T.E. Nieminen, M. Meschke, J.M. Kivioja, Antti Niskanen, J.J. Vartiainen

Research output: Contribution to journalArticleScientificpeer-review

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Abstract

We have measured the influence of shot noise on hysteretic Josephson junctions initially in the macroscopic quantum tunneling regime. The escape threshold current into the resistive state decreases monotonically with increasing average current through the scattering conductor, which is another tunnel junction. Escape is predominantly determined by excitation due to the wideband shot noise. This process is equivalent to thermal activation (TA) over the barrier at effective temperatures up to about 4 times the critical temperature of the superconductor. The presented TA model is in excellent agreement with the experimental results.
Original languageEnglish
Article number197004
Number of pages4
JournalPhysical Review Letters
Volume95
Issue number19
DOIs
Publication statusPublished - 2005
MoE publication typeA1 Journal article-refereed

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shot noise
Josephson junctions
escape
activation
threshold currents
tunnel junctions
critical temperature
conductors
broadband
scattering
excitation
temperature

Keywords

  • Josephson junction

Cite this

Pekola, J. P., Nieminen, T. E., Meschke, M., Kivioja, J. M., Niskanen, A., & Vartiainen, J. J. (2005). Shot-noise-driven escape in hysteretic Josephson junctions. Physical Review Letters, 95(19), [197004]. https://doi.org/10.1103/PhysRevLett.95.197004
Pekola, J.P. ; Nieminen, T.E. ; Meschke, M. ; Kivioja, J.M. ; Niskanen, Antti ; Vartiainen, J.J. / Shot-noise-driven escape in hysteretic Josephson junctions. In: Physical Review Letters. 2005 ; Vol. 95, No. 19.
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Pekola, JP, Nieminen, TE, Meschke, M, Kivioja, JM, Niskanen, A & Vartiainen, JJ 2005, 'Shot-noise-driven escape in hysteretic Josephson junctions', Physical Review Letters, vol. 95, no. 19, 197004. https://doi.org/10.1103/PhysRevLett.95.197004

Shot-noise-driven escape in hysteretic Josephson junctions. / Pekola, J.P.; Nieminen, T.E.; Meschke, M.; Kivioja, J.M.; Niskanen, Antti; Vartiainen, J.J.

In: Physical Review Letters, Vol. 95, No. 19, 197004, 2005.

Research output: Contribution to journalArticleScientificpeer-review

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T1 - Shot-noise-driven escape in hysteretic Josephson junctions

AU - Pekola, J.P.

AU - Nieminen, T.E.

AU - Meschke, M.

AU - Kivioja, J.M.

AU - Niskanen, Antti

AU - Vartiainen, J.J.

PY - 2005

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N2 - We have measured the influence of shot noise on hysteretic Josephson junctions initially in the macroscopic quantum tunneling regime. The escape threshold current into the resistive state decreases monotonically with increasing average current through the scattering conductor, which is another tunnel junction. Escape is predominantly determined by excitation due to the wideband shot noise. This process is equivalent to thermal activation (TA) over the barrier at effective temperatures up to about 4 times the critical temperature of the superconductor. The presented TA model is in excellent agreement with the experimental results.

AB - We have measured the influence of shot noise on hysteretic Josephson junctions initially in the macroscopic quantum tunneling regime. The escape threshold current into the resistive state decreases monotonically with increasing average current through the scattering conductor, which is another tunnel junction. Escape is predominantly determined by excitation due to the wideband shot noise. This process is equivalent to thermal activation (TA) over the barrier at effective temperatures up to about 4 times the critical temperature of the superconductor. The presented TA model is in excellent agreement with the experimental results.

KW - Josephson junction

U2 - 10.1103/PhysRevLett.95.197004

DO - 10.1103/PhysRevLett.95.197004

M3 - Article

VL - 95

JO - Physical Review Letters

JF - Physical Review Letters

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Pekola JP, Nieminen TE, Meschke M, Kivioja JM, Niskanen A, Vartiainen JJ. Shot-noise-driven escape in hysteretic Josephson junctions. Physical Review Letters. 2005;95(19). 197004. https://doi.org/10.1103/PhysRevLett.95.197004