Silica Functionalization: How Does it Affect Space Charge Accumulation in Nanodielectrics Under DC?

Amirhossein Mahtabani; Ilkka Rytöluoto; Rafal Anyszka; Xiaozhen He; Eetta Saarimäki; Kari Lahti; Mika Paajanen; Wilma Dierkes; Anke Blume

doi:10.1109/ICD46958.2020.9341818

Silica Functionalization: How Does it Affect Space Charge Accumulation in Nanodielectrics Under DC?

Amirhossein Mahtabani, Ilkka Rytöluoto, Rafal Anyszka, Xiaozhen He, Eetta Saarimäki, Kari Lahti, Mika Paajanen, Wilma Dierkes, Anke Blume

BA3609 Materials processing and circular solutions

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

Original language	English
Title of host publication	2020 IEEE International Conference on Dielectrics (ICD 2020)
Publisher	IEEE Institute of Electrical and Electronic Engineers
Pages	281-284
Number of pages	4
ISBN (Electronic)	978-1-7281-8983-3
DOIs	https://doi.org/10.1109/ICD46958.2020.9341818
Publication status	Published - 5 Jul 2020
MoE publication type	A4 Article in a conference publication
Event	IEEE 2020 International Conference on Dielectrics, ICD 2020: Virtual Edition - Valencia, Spain Duration: 6 Jul 2020 → 31 Jul 2020

Conference

Conference	IEEE 2020 International Conference on Dielectrics, ICD 2020
Country	Spain
City	Valencia
Period	6/07/20 → 31/07/20

Access to Document

10.1109/ICD46958.2020.9341818

Cite this

Mahtabani, A., Rytöluoto, I., Anyszka, R., He, X., Saarimäki, E., Lahti, K., Paajanen, M., Dierkes, W., & Blume, A. (2020). Silica Functionalization: How Does it Affect Space Charge Accumulation in Nanodielectrics Under DC? In 2020 IEEE International Conference on Dielectrics (ICD 2020) (pp. 281-284). IEEE Institute of Electrical and Electronic Engineers. https://doi.org/10.1109/ICD46958.2020.9341818

Mahtabani, Amirhossein ; Rytöluoto, Ilkka ; Anyszka, Rafal ; He, Xiaozhen ; Saarimäki, Eetta ; Lahti, Kari ; Paajanen, Mika ; Dierkes, Wilma ; Blume, Anke. / Silica Functionalization: How Does it Affect Space Charge Accumulation in Nanodielectrics Under DC?. 2020 IEEE International Conference on Dielectrics (ICD 2020). IEEE Institute of Electrical and Electronic Engineers, 2020. pp. 281-284

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title = "Silica Functionalization: How Does it Affect Space Charge Accumulation in Nanodielectrics Under DC?",

author = "Amirhossein Mahtabani and Ilkka Ryt{\"o}luoto and Rafal Anyszka and Xiaozhen He and Eetta Saarim{\"a}ki and Kari Lahti and Mika Paajanen and Wilma Dierkes and Anke Blume",

year = "2020",

month = jul,

day = "5",

doi = "10.1109/ICD46958.2020.9341818",

language = "English",

pages = "281--284",

booktitle = "2020 IEEE International Conference on Dielectrics (ICD 2020)",

publisher = "IEEE Institute of Electrical and Electronic Engineers",

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note = "IEEE 2020 International Conference on Dielectrics, ICD 2020 : Virtual Edition ; Conference date: 06-07-2020 Through 31-07-2020",

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Mahtabani, A, Rytöluoto, I, Anyszka, R, He, X, Saarimäki, E, Lahti, K, Paajanen, M, Dierkes, W & Blume, A 2020, Silica Functionalization: How Does it Affect Space Charge Accumulation in Nanodielectrics Under DC? in 2020 IEEE International Conference on Dielectrics (ICD 2020). IEEE Institute of Electrical and Electronic Engineers, pp. 281-284, IEEE 2020 International Conference on Dielectrics, ICD 2020, Valencia, Spain, 6/07/20. https://doi.org/10.1109/ICD46958.2020.9341818

Silica Functionalization: How Does it Affect Space Charge Accumulation in Nanodielectrics Under DC? / Mahtabani, Amirhossein; Rytöluoto, Ilkka; Anyszka, Rafal; He, Xiaozhen; Saarimäki, Eetta; Lahti, Kari; Paajanen, Mika; Dierkes, Wilma; Blume, Anke.

2020 IEEE International Conference on Dielectrics (ICD 2020). IEEE Institute of Electrical and Electronic Engineers, 2020. p. 281-284.

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review