Abstract
Experiments on side-gated silicon single electron transistors (SET) fabricated on a heavily doped thin silicon-on-insulator substrate are reported. Some of the devices showed single-island-like and some multi-island-like behaviour, but the properties of individual samples changed with time. Single-electron gate modulation was observable up to T=100 K, at least. A slow response of SET current to a large change in gate voltage was observed, but the process speeded up under illumination.
| Original language | English |
|---|---|
| Pages (from-to) | 2013-2016 |
| Number of pages | 4 |
| Journal | Japanese Journal of Applied Physics |
| Volume | 40 |
| Issue number | 3B |
| DOIs | |
| Publication status | Published - 2001 |
| MoE publication type | A1 Journal article-refereed |
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