Single pixel characterization of X-ray TES microcalorimeter under AC bias at MHz frequencies

H. Akamatsu, L. Gottardi, J. Adams, C. Bailey, S. Bandler, M. Bruijn, J. Chervenak, M. Eckart, F. Finkbeiner, R. Den Hartog, H. Hoevers, R. Kelley, J. van Der Kuur, T. Van Den Linden, M. Lindeman, F. Porter, J. Sadleir, S. Smith, J. Beyer, Mikko Kiviranta

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    Abstract

    In this paper, we present the progress made at SRON in the read-out of X-ray Transition Edge Sensor (TES) microcalorimeters under AC bias. The experiments reported so far, whose aim was to demonstrate an energy resolution of 2 eV at 6 keV with a TES acting as a modulator, were carried out at frequencies below 700 kHz using a standard flux locked loop SQUID read-out scheme. The TES read-out suffered from the use of suboptimal circuit components, large parasitic inductances, low quality factor resonators, and poor magnetic field shielding. We have developed a novel experimental set-up that allows us to test several read-out schemes in a single cryogenic run. In this set-up, the TES pixels from a GSFC array are coupled via superconducting transformers to 18 high-Q lithographic LC filters with resonant frequencies ranging between 2 and 5 MHz. The signal is amplified by a two-stage SQUID current sensor and baseband feedback is used to overcome the limited SQUID dynamic range. We measured an X-ray energy resolution of 3.6 eV at 1.4 MHz, which is consistent with the measured integrated Noise Equivalent Power.
    Original languageEnglish
    Article number2100503
    Number of pages3
    JournalIEEE Transactions on Applied Superconductivity
    Volume23
    Issue number3
    DOIs
    Publication statusPublished - 2013
    MoE publication typeA1 Journal article-refereed
    EventApplied Superconductivity Conference, ASC 2012 - Portland, United States
    Duration: 7 Oct 201212 Oct 2012

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    Keywords

    • astrophysics
    • spectroscopy
    • x-ray
    • detectors

    Cite this

    Akamatsu, H., Gottardi, L., Adams, J., Bailey, C., Bandler, S., Bruijn, M., Chervenak, J., Eckart, M., Finkbeiner, F., Den Hartog, R., Hoevers, H., Kelley, R., van Der Kuur, J., Van Den Linden, T., Lindeman, M., Porter, F., Sadleir, J., Smith, S., Beyer, J., & Kiviranta, M. (2013). Single pixel characterization of X-ray TES microcalorimeter under AC bias at MHz frequencies. IEEE Transactions on Applied Superconductivity, 23(3), [2100503]. https://doi.org/10.1109/TASC.2012.2235509