SIS junctions with frequency dependent damping for a programmable Josephson voltage standard

Juha Hassel, Heikki Seppä, Leif Grönberg, Ilkka Suni

    Research output: Contribution to journalArticleScientificpeer-review

    21 Citations (Scopus)

    Abstract

    Experimental and computational results on programmable Josephson junction array (JJA) chips based on superconductor-insulator-superconductor (SIS) junctions are presented. Implications of circuit design and fabrication process on the performance are discussed. We introduce a method to decrease the attenuation of the pump microwave. Different designs are compared, suggesting that 1 V chips operating at the third constant voltage step with 70 GHz pump frequency can be produced with our process.
    Original languageEnglish
    Pages (from-to)195-198
    Number of pages4
    JournalIEEE Transactions on Instrumentation and Measurement
    Volume50
    Issue number2
    DOIs
    Publication statusPublished - 2001
    MoE publication typeA1 Journal article-refereed

    Fingerprint

    SIS (superconductors)
    Superconducting materials
    Damping
    damping
    chips
    Pumps
    pumps
    Electric potential
    electric potential
    Josephson junctions
    attenuation
    Microwaves
    microwaves
    Fabrication
    fabrication
    Networks (circuits)

    Cite this

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    title = "SIS junctions with frequency dependent damping for a programmable Josephson voltage standard",
    abstract = "Experimental and computational results on programmable Josephson junction array (JJA) chips based on superconductor-insulator-superconductor (SIS) junctions are presented. Implications of circuit design and fabrication process on the performance are discussed. We introduce a method to decrease the attenuation of the pump microwave. Different designs are compared, suggesting that 1 V chips operating at the third constant voltage step with 70 GHz pump frequency can be produced with our process.",
    author = "Juha Hassel and Heikki Sepp{\"a} and Leif Gr{\"o}nberg and Ilkka Suni",
    year = "2001",
    doi = "10.1109/19.918100",
    language = "English",
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    pages = "195--198",
    journal = "IEEE Transactions on Instrumentation and Measurement",
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    publisher = "IEEE Institute of Electrical and Electronic Engineers",
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    SIS junctions with frequency dependent damping for a programmable Josephson voltage standard. / Hassel, Juha; Seppä, Heikki; Grönberg, Leif; Suni, Ilkka.

    In: IEEE Transactions on Instrumentation and Measurement, Vol. 50, No. 2, 2001, p. 195-198.

    Research output: Contribution to journalArticleScientificpeer-review

    TY - JOUR

    T1 - SIS junctions with frequency dependent damping for a programmable Josephson voltage standard

    AU - Hassel, Juha

    AU - Seppä, Heikki

    AU - Grönberg, Leif

    AU - Suni, Ilkka

    PY - 2001

    Y1 - 2001

    N2 - Experimental and computational results on programmable Josephson junction array (JJA) chips based on superconductor-insulator-superconductor (SIS) junctions are presented. Implications of circuit design and fabrication process on the performance are discussed. We introduce a method to decrease the attenuation of the pump microwave. Different designs are compared, suggesting that 1 V chips operating at the third constant voltage step with 70 GHz pump frequency can be produced with our process.

    AB - Experimental and computational results on programmable Josephson junction array (JJA) chips based on superconductor-insulator-superconductor (SIS) junctions are presented. Implications of circuit design and fabrication process on the performance are discussed. We introduce a method to decrease the attenuation of the pump microwave. Different designs are compared, suggesting that 1 V chips operating at the third constant voltage step with 70 GHz pump frequency can be produced with our process.

    U2 - 10.1109/19.918100

    DO - 10.1109/19.918100

    M3 - Article

    VL - 50

    SP - 195

    EP - 198

    JO - IEEE Transactions on Instrumentation and Measurement

    JF - IEEE Transactions on Instrumentation and Measurement

    SN - 0018-9456

    IS - 2

    ER -