Spectral Reflectance Processing via Local Wavelength-Direction Correlations

Guanglang  Xu; Maria Gritsevich; Jouni Peltoniemi; Antti Penttilä; Olli Wilkman; Olli Ihalainen; Karri Muinonen

doi:10.1109/lgrs.2019.2939228

Spectral Reflectance Processing via Local Wavelength-Direction Correlations

Guanglang Xu, Maria Gritsevich, Jouni Peltoniemi, Antti Penttilä, Olli Wilkman, Olli Ihalainen, Karri Muinonen

Not published at VTT

Research output: Contribution to journal › Article › Scientific › peer-review

1 Citation (Scopus)

Abstract

The spectral bidirectional reflectance distribution function (BRDF) maps incident radiation of a surface to its outgoing counterpart at different wavelengths. This function plays a fundamental role in characterizing the various types of earth surfaces. Due to its high dimensionality, the measurements, analysis, and simulation of spectral BRDF are challenging. In this letter, we introduce a new method for processing spectral reflectance using the so-called data-adjacency, i.e., the correlation between adjacent wavelengths and viewing directions. The results show that the benefits of efficient representation, noise reduction, and analysis capability can all be integrated to the data.

Original language	English
Article number	8845665
Pages (from-to)	948-952
Number of pages	5
Journal	IEEE Geoscience and Remote Sensing Letters
Volume	17
Issue number	6
DOIs	https://doi.org/10.1109/lgrs.2019.2939228
Publication status	Published - Jun 2020
MoE publication type	A1 Journal article-refereed

Keywords

Remote sensing
spectroradiometers
wavelet transforms

Access to Document

10.1109/lgrs.2019.2939228

Cite this

@article{293f86d0f14642ac87e0211321adc6e3,

title = "Spectral Reflectance Processing via Local Wavelength-Direction Correlations",

abstract = "The spectral bidirectional reflectance distribution function (BRDF) maps incident radiation of a surface to its outgoing counterpart at different wavelengths. This function plays a fundamental role in characterizing the various types of earth surfaces. Due to its high dimensionality, the measurements, analysis, and simulation of spectral BRDF are challenging. In this letter, we introduce a new method for processing spectral reflectance using the so-called data-adjacency, i.e., the correlation between adjacent wavelengths and viewing directions. The results show that the benefits of efficient representation, noise reduction, and analysis capability can all be integrated to the data.",

keywords = "Remote sensing, spectroradiometers, wavelet transforms",

author = "Guanglang Xu and Maria Gritsevich and Jouni Peltoniemi and Antti Penttil{\"a} and Olli Wilkman and Olli Ihalainen and Karri Muinonen",

note = "Funding Information: Manuscript received June 5, 2019; revised August 13, 2019; accepted August 31, 2019. Date of publication September 20, 2019; date of current version May 21, 2020. This work was supported by the Academy of Finland Consortium Project Albedo under Project 298137 and Project 298139. (Corresponding author: Guanglang Xu.) G. Xu, A. Penttil{\"a}, and O. Ihalainen are with the Department of Physics, University of Helsinki, 00100 Helsinki, Finland (e-mail: guanglang.xu@helsinki.fi). Publisher Copyright: {\textcopyright} 2019 IEEE.",

year = "2020",

month = jun,

doi = "10.1109/lgrs.2019.2939228",

language = "English",

volume = "17",

pages = "948--952",

journal = "IEEE Geoscience and Remote Sensing Letters",

issn = "1545-598X",

publisher = "IEEE Institute of Electrical and Electronic Engineers",

number = "6",

}

TY - JOUR

T1 - Spectral Reflectance Processing via Local Wavelength-Direction Correlations

AU - Xu, Guanglang

AU - Gritsevich, Maria

AU - Peltoniemi, Jouni

AU - Penttilä, Antti

AU - Wilkman, Olli

AU - Ihalainen, Olli

AU - Muinonen, Karri

N1 - Funding Information: Manuscript received June 5, 2019; revised August 13, 2019; accepted August 31, 2019. Date of publication September 20, 2019; date of current version May 21, 2020. This work was supported by the Academy of Finland Consortium Project Albedo under Project 298137 and Project 298139. (Corresponding author: Guanglang Xu.) G. Xu, A. Penttilä, and O. Ihalainen are with the Department of Physics, University of Helsinki, 00100 Helsinki, Finland (e-mail: guanglang.xu@helsinki.fi). Publisher Copyright: © 2019 IEEE.

PY - 2020/6

Y1 - 2020/6

N2 - The spectral bidirectional reflectance distribution function (BRDF) maps incident radiation of a surface to its outgoing counterpart at different wavelengths. This function plays a fundamental role in characterizing the various types of earth surfaces. Due to its high dimensionality, the measurements, analysis, and simulation of spectral BRDF are challenging. In this letter, we introduce a new method for processing spectral reflectance using the so-called data-adjacency, i.e., the correlation between adjacent wavelengths and viewing directions. The results show that the benefits of efficient representation, noise reduction, and analysis capability can all be integrated to the data.

AB - The spectral bidirectional reflectance distribution function (BRDF) maps incident radiation of a surface to its outgoing counterpart at different wavelengths. This function plays a fundamental role in characterizing the various types of earth surfaces. Due to its high dimensionality, the measurements, analysis, and simulation of spectral BRDF are challenging. In this letter, we introduce a new method for processing spectral reflectance using the so-called data-adjacency, i.e., the correlation between adjacent wavelengths and viewing directions. The results show that the benefits of efficient representation, noise reduction, and analysis capability can all be integrated to the data.

KW - Remote sensing

KW - spectroradiometers

KW - wavelet transforms

UR - http://www.scopus.com/inward/record.url?scp=85077442260&partnerID=8YFLogxK

U2 - 10.1109/lgrs.2019.2939228

DO - 10.1109/lgrs.2019.2939228

M3 - Article

SN - 1545-598X

VL - 17

SP - 948

EP - 952

JO - IEEE Geoscience and Remote Sensing Letters

JF - IEEE Geoscience and Remote Sensing Letters

IS - 6

M1 - 8845665

ER -

Spectral Reflectance Processing via Local Wavelength-Direction Correlations

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this