Stability of electrostatic actuation of MEMS

Anu Kärkkäinen, Aarne Oja, Jukka Kyynäräinen, Heikki Kuisma, Heikki Seppä

    Research output: Contribution to journalArticleScientificpeer-review

    19 Citations (Scopus)


    The increased electrostatic stability of MEMS sensors enables new application areas for the sensors, and decreases the manufacturing costs of existing products. Especially in the applications where the MEMS component is operated under bias voltage close to the pull-in point, the undesired instability phenomenon becomes a major source of inaccuracy. We demonstrate that biasing the sensor to the pull-in point using AC voltage is significantly more stable than the conventionally used DC voltage biasing.
    Original languageEnglish
    Pages (from-to)193 - 194
    Number of pages2
    JournalPhysica Scripta
    Publication statusPublished - 2004
    MoE publication typeA1 Journal article-refereed
    Event20th Nordic Semiconductor Meeting, NSM20 - Tampere, Finland
    Duration: 25 Aug 200327 Aug 2003


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