Stable SOI micromachined electrostatic AC voltage reference

Anu Kärkkäinen (Corresponding Author), Panu Pekko, James Dekker, Nadine Pesonen, Mika Suhonen, Aarne Oja, Jukka Kyynäräinen, Heikki Seppä

    Research output: Contribution to journalArticleScientificpeer-review

    6 Citations (Scopus)

    Abstract

    We have designed and manufactured a micromachined moving plate capacitor to be used as an AC voltage reference in electrical metrology. The reference is based on the characteristic AC current–voltage curve of the component having a maximum, the value of which ideally depends only on the geometry of the component and material properties of single crystalline silicon. The electrode surface stability is essential in this application and hence a new fabrication process has been developed to metallize both surfaces of an electrostatically actuated micromachined structure. The stability of the AC reference voltage at a frequency of 100 kHz and an RMS voltage value 6.4 V was measured to be ±60 ppm over 14 h.
    Original languageEnglish
    Pages (from-to)169 - 172
    Number of pages4
    JournalMicrosystem Technologies
    Volume12
    Issue number1-2
    DOIs
    Publication statusPublished - 2005
    MoE publication typeA1 Journal article-refereed

    Keywords

    • metrology
    • capacitors
    • SOI

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