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Stack Degradation in Dependence of Operation Parameter: The Real-SOFC Sensitivity Analysis

  • L.G.J. de Haart*
  • , J. Mougin
  • , O. Posdziech
  • , Jari Kiviaho
  • , N.H. Menzler
    • *Corresponding author for this work

    Research output: Contribution to journal › Article › Scientific › peer-review

    104   Link opens in a new tab Citations (Scopus)

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