Status and Strategy for Moisture Metrology in European Metrology Institutes

S. Bell, N. Boese, R. Bosma, M. Buzoianu, P. Carroll, V. Fernicola, E. Georgin, M. Heinonen, A. Kentved, C. Melvad, J. Nielsen

    Research output: Contribution to journalArticleScientificpeer-review

    2 Citations (Scopus)

    Abstract

    Measurement of moisture in materials presents many challenges, due to diverse measuring principles, sample interactions with atmosphere, and variation in what is measured (either water content alone or moisture including other liquids). Calibrations are variously referenced to published standard methods, primary calibration facilities, or certified reference materials, but each of these addresses limited substances and ranges of measurement. Overall, metrology infrastructure is not as fully developed or coherent for this field as it is for many other areas of measurement. In order to understand the metrology needs and to support developments, several European national metrology institutes (NMIs) have undertaken some collaborative activities. These have included a “cooperation in research” project for sharing of information, a survey of moisture capabilities at NMIs, the formulation of a strategy for moisture metrology at the NMI level, and a funded research project to develop improved metrology for the moisture field. This paper summarizes the information gathered, giving an overview of the status of moisture metrology at NMIs, and it reports a proposed strategy to improve the current situation.

    Original languageEnglish
    Pages (from-to)2185-2198
    Number of pages14
    JournalInternational Journal of Thermophysics
    Volume36
    Issue number8
    DOIs
    Publication statusPublished - 2 Aug 2015
    MoE publication typeA1 Journal article-refereed

    Keywords

    • Certified reference materials
    • Measurement traceability
    • Moisture content
    • Strategy
    • Water content

    Fingerprint

    Dive into the research topics of 'Status and Strategy for Moisture Metrology in European Metrology Institutes'. Together they form a unique fingerprint.

    Cite this