Stitching accuracy in large area scanning probe microscopy
- Petr Klapetek*
- , David Nečas*
- , Edward Heaps
- , Bruno Sauvet
- , Vojtěch Klapetek
- , Miroslav Valtr*
- , Virpi Korpelainen
- , Andrew Yacoot*
*Corresponding author for this work
- Czech Metrology Institute (CMI)
- Central European Institute of Technology (CEITEC)
- National Physics Laboratory (NPL)
- Masaryk University
Research output: Contribution to journal › Article › Scientific › peer-review
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