Strain and electrical characterization of metal-oxide-semiconductor field-effect transistor fabricated on mechanically and thermally transferred silicon on insulator films

F. Lu (Corresponding Author), J. Bickford, C. Novotny, P.K.L. Yu, S.S. Lau, Kimmo Henttinen, Tommi Suni, Ilkka Suni

Research output: Contribution to journalArticleScientificpeer-review

2 Citations (Scopus)

Fingerprint Dive into the research topics of 'Strain and electrical characterization of metal-oxide-semiconductor field-effect transistor fabricated on mechanically and thermally transferred silicon on insulator films'. Together they form a unique fingerprint.

Engineering & Materials Science