Strain and electrical characterization of metal-oxide-semiconductor field-effect transistor fabricated on mechanically and thermally transferred silicon on insulator films
- F. Lu*
- , J. Bickford
- , C. Novotny
- , P.K.L. Yu
- , S.S. Lau
- , Kimmo Henttinen
- , Tommi Suni
- , Ilkka Suni
*Corresponding author for this work
- University of California, San Diego
Research output: Contribution to journal › Article › Scientific › peer-review
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