Strain and electrical characterization of metal-oxide-semiconductor field-effect transistor fabricated on mechanically and thermally transferred silicon on insulator films

F. Lu*, J. Bickford, C. Novotny, P.K.L. Yu, S.S. Lau, Kimmo Henttinen, Tommi Suni, Ilkka Suni

*Corresponding author for this work

Research output: Contribution to journal › Article › Scientific › peer-review

2 Citations (Scopus)

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