Stress and film thickness effects on the optical properties of ferroelectric Pb(ZrxTi1-x)O3 films

Lappalainen Jyrki, Johannes Frantti, Jussi Hiltunen, Lantto Vilho, Masato Kakihana

Research output: Contribution to journalArticleScientificpeer-review

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Abstract

Spectrophotometry measurements at wavelengths from 180 nm to 3000 nm, x-ray diffraction, and Raman spectroscopy were used in the characterization of polycrystalline Pb(Zr x Ti 1− x )O 3 films with various thicknesses deposited by pulsed laser deposition on MgO substrates. It was found that films were under a strong compressive stress increasing up to 1.3 GPa with decreasing film thickness down to 80 nm. A clear blue shift of the optical absorption edge was found in transmission spectra leading to an increase of band gap energy from 3.9 eV to 4.5 eV. Both refractive index and extinction coefficient increased at the wavelengths below 500 nm with decreasing film thickness.
Original languageEnglish
Pages (from-to)149-158
Number of pages10
JournalFerroelectrics
Volume335
Issue number1
DOIs
Publication statusPublished - 2006
MoE publication typeA1 Journal article-refereed

Fingerprint

Ferroelectric materials
Film thickness
film thickness
Optical properties
optical properties
Wavelength
Spectrophotometry
spectrophotometry
Pulsed laser deposition
Compressive stress
blue shift
wavelengths
Light absorption
pulsed laser deposition
Raman spectroscopy
Refractive index
extinction
Energy gap
optical absorption
x ray diffraction

Keywords

  • PNZT thin films
  • macroscopic stress
  • band gap blue shift

Cite this

Jyrki, Lappalainen ; Frantti, Johannes ; Hiltunen, Jussi ; Vilho, Lantto ; Kakihana, Masato. / Stress and film thickness effects on the optical properties of ferroelectric Pb(ZrxTi1-x)O3 films. In: Ferroelectrics. 2006 ; Vol. 335, No. 1. pp. 149-158.
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abstract = "Spectrophotometry measurements at wavelengths from 180 nm to 3000 nm, x-ray diffraction, and Raman spectroscopy were used in the characterization of polycrystalline Pb(Zr x Ti 1− x )O 3 films with various thicknesses deposited by pulsed laser deposition on MgO substrates. It was found that films were under a strong compressive stress increasing up to 1.3 GPa with decreasing film thickness down to 80 nm. A clear blue shift of the optical absorption edge was found in transmission spectra leading to an increase of band gap energy from 3.9 eV to 4.5 eV. Both refractive index and extinction coefficient increased at the wavelengths below 500 nm with decreasing film thickness.",
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Stress and film thickness effects on the optical properties of ferroelectric Pb(ZrxTi1-x)O3 films. / Jyrki, Lappalainen; Frantti, Johannes; Hiltunen, Jussi; Vilho, Lantto; Kakihana, Masato.

In: Ferroelectrics, Vol. 335, No. 1, 2006, p. 149-158.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - Stress and film thickness effects on the optical properties of ferroelectric Pb(ZrxTi1-x)O3 films

AU - Jyrki, Lappalainen

AU - Frantti, Johannes

AU - Hiltunen, Jussi

AU - Vilho, Lantto

AU - Kakihana, Masato

N1 - Project code: 4678

PY - 2006

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N2 - Spectrophotometry measurements at wavelengths from 180 nm to 3000 nm, x-ray diffraction, and Raman spectroscopy were used in the characterization of polycrystalline Pb(Zr x Ti 1− x )O 3 films with various thicknesses deposited by pulsed laser deposition on MgO substrates. It was found that films were under a strong compressive stress increasing up to 1.3 GPa with decreasing film thickness down to 80 nm. A clear blue shift of the optical absorption edge was found in transmission spectra leading to an increase of band gap energy from 3.9 eV to 4.5 eV. Both refractive index and extinction coefficient increased at the wavelengths below 500 nm with decreasing film thickness.

AB - Spectrophotometry measurements at wavelengths from 180 nm to 3000 nm, x-ray diffraction, and Raman spectroscopy were used in the characterization of polycrystalline Pb(Zr x Ti 1− x )O 3 films with various thicknesses deposited by pulsed laser deposition on MgO substrates. It was found that films were under a strong compressive stress increasing up to 1.3 GPa with decreasing film thickness down to 80 nm. A clear blue shift of the optical absorption edge was found in transmission spectra leading to an increase of band gap energy from 3.9 eV to 4.5 eV. Both refractive index and extinction coefficient increased at the wavelengths below 500 nm with decreasing film thickness.

KW - PNZT thin films

KW - macroscopic stress

KW - band gap blue shift

U2 - 10.1080/00150190600689720

DO - 10.1080/00150190600689720

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JO - Ferroelectrics

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SN - 0015-0193

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