Stress and film thickness effects on the optical properties of ferroelectric Pb(ZrxTi1-x)O3 films

Lappalainen Jyrki, Johannes Frantti, Jussi Hiltunen, Lantto Vilho, Masato Kakihana

Research output: Contribution to journalArticleScientificpeer-review

15 Citations (Scopus)

Abstract

Spectrophotometry measurements at wavelengths from 180 nm to 3000 nm, x-ray diffraction, and Raman spectroscopy were used in the characterization of polycrystalline Pb(Zr x Ti 1− x )O 3 films with various thicknesses deposited by pulsed laser deposition on MgO substrates. It was found that films were under a strong compressive stress increasing up to 1.3 GPa with decreasing film thickness down to 80 nm. A clear blue shift of the optical absorption edge was found in transmission spectra leading to an increase of band gap energy from 3.9 eV to 4.5 eV. Both refractive index and extinction coefficient increased at the wavelengths below 500 nm with decreasing film thickness.
Original languageEnglish
Pages (from-to)149-158
Number of pages10
JournalFerroelectrics
Volume335
Issue number1
DOIs
Publication statusPublished - 2006
MoE publication typeA1 Journal article-refereed

Keywords

  • PNZT thin films
  • macroscopic stress
  • band gap blue shift

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