Stress and film thickness effects on the optical properties of ferroelectric Pb(ZrxTi1-x)O3 films

Lappalainen Jyrki, Johannes Frantti, Jussi Hiltunen, Lantto Vilho, Masato Kakihana

    Research output: Contribution to journalArticleScientificpeer-review

    15 Citations (Scopus)

    Abstract

    Spectrophotometry measurements at wavelengths from 180 nm to 3000 nm, x-ray diffraction, and Raman spectroscopy were used in the characterization of polycrystalline Pb(Zr x Ti 1− x )O 3 films with various thicknesses deposited by pulsed laser deposition on MgO substrates. It was found that films were under a strong compressive stress increasing up to 1.3 GPa with decreasing film thickness down to 80 nm. A clear blue shift of the optical absorption edge was found in transmission spectra leading to an increase of band gap energy from 3.9 eV to 4.5 eV. Both refractive index and extinction coefficient increased at the wavelengths below 500 nm with decreasing film thickness.
    Original languageEnglish
    Pages (from-to)149-158
    Number of pages10
    JournalFerroelectrics
    Volume335
    Issue number1
    DOIs
    Publication statusPublished - 2006
    MoE publication typeA1 Journal article-refereed

    Keywords

    • PNZT thin films
    • macroscopic stress
    • band gap blue shift

    Fingerprint

    Dive into the research topics of 'Stress and film thickness effects on the optical properties of ferroelectric Pb(Zr<sub>x</sub>Ti<sub>1-x</sub>)O<sub>3</sub> films'. Together they form a unique fingerprint.

    Cite this