TY - JOUR
T1 - Stress-induced magnetization in A (100) [001] Fe–3wt% Si polycrystal influenced by a [100] magnetic field white synchrotron radiation (Bragg reflection) topography
AU - Stephenson, J.D.
AU - Tuomi, T.
AU - Kelhä, Väinö
PY - 1980
Y1 - 1980
N2 - White synchrotron radiation (DORIS, Hamburg) is used in Bragg reflection topography to observe magnetic stripe domain behaviour in a (100) Fe–3wt% Si polycrystal subjected to both, [010] compressive and [100] magnetic field stresses. Each type of increased stress creates [010] stripe domain climb through inherent [001] stripe domains. A bulk defect is detected from surface (distorted stripe domain) stress patterns.
AB - White synchrotron radiation (DORIS, Hamburg) is used in Bragg reflection topography to observe magnetic stripe domain behaviour in a (100) Fe–3wt% Si polycrystal subjected to both, [010] compressive and [100] magnetic field stresses. Each type of increased stress creates [010] stripe domain climb through inherent [001] stripe domains. A bulk defect is detected from surface (distorted stripe domain) stress patterns.
U2 - 10.1002/pssa.2210570120
DO - 10.1002/pssa.2210570120
M3 - Article
VL - 57
SP - 191
EP - 202
JO - Physica Status Solidi A: Applications and Materials Science
JF - Physica Status Solidi A: Applications and Materials Science
SN - 1862-6300
IS - 1
ER -