Skip to main navigation Skip to search Skip to main content

Stress-induced magnetization in A (100) [001] Fe–3wt% Si polycrystal influenced by a [100] magnetic field white synchrotron radiation (Bragg reflection) topography

  • J.D. Stephenson
  • , T. Tuomi
  • , Väinö Kelhä
  • Max Planck Society
  • Helsinki University of Technology

Research output: Contribution to journalArticleScientificpeer-review

Abstract

White synchrotron radiation (DORIS, Hamburg) is used in Bragg reflection topography to observe magnetic stripe domain behaviour in a (100) Fe–3wt% Si polycrystal subjected to both, [010] compressive and [100] magnetic field stresses. Each type of increased stress creates [010] stripe domain climb through inherent [001] stripe domains. A bulk defect is detected from surface (distorted stripe domain) stress patterns.
Original languageEnglish
Pages (from-to)191-202
JournalPhysica Status Solidi A: Applied Research
Volume57
Issue number1
DOIs
Publication statusPublished - 1980
MoE publication typeNot Eligible

Fingerprint

Dive into the research topics of 'Stress-induced magnetization in A (100) [001] Fe–3wt% Si polycrystal influenced by a [100] magnetic field white synchrotron radiation (Bragg reflection) topography'. Together they form a unique fingerprint.

Cite this