Abstract
White synchrotron radiation (DORIS, Hamburg) is used in Bragg reflection topography to observe magnetic stripe domain behaviour in a (100) Fe–3wt% Si polycrystal subjected to both, [010] compressive and [100] magnetic field stresses. Each type of increased stress creates [010] stripe domain climb through inherent [001] stripe domains. A bulk defect is detected from surface (distorted stripe domain) stress patterns.
| Original language | English |
|---|---|
| Pages (from-to) | 191 - 202 |
| Number of pages | 12 |
| Journal | Physica Status Solidi A: Applied Research |
| Volume | 57 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 1980 |
| MoE publication type | Not Eligible |
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Stephenson, J., Tuomi, T., & Kelhä, V. (1980). Stress‐induced magnetization in A (100)
[001] Fe–3wt% Si polycrystal influenced by a [100] magnetic field white
synchrotron radiation (Bragg reflection) topography. Physica Status Solidi A: Applied Research, 57(1), 191 - 202. https://doi.org/10.1002/pssa.2210570120