Stress‐induced magnetization in A (100) [001] Fe–3wt% Si polycrystal influenced by a [100] magnetic field white synchrotron radiation (Bragg reflection) topography

J. Stephenson, T. Tuomi, Väinö Kelhä

Research output: Contribution to journalArticleScientificpeer-review

9 Citations (Scopus)

Abstract

White synchrotron radiation (DORIS, Hamburg) is used in Bragg reflection topography to observe magnetic stripe domain behaviour in a (100) Fe–3wt% Si polycrystal subjected to both, [010] compressive and [100] magnetic field stresses. Each type of increased stress creates [010] stripe domain climb through inherent [001] stripe domains. A bulk defect is detected from surface (distorted stripe domain) stress patterns.

Original languageEnglish
Pages (from-to)191 - 202
Number of pages12
JournalPhysica Status Solidi A: Applied Research
Volume57
Issue number1
DOIs
Publication statusPublished - 1980
MoE publication typeNot Eligible

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