Stress‐induced magnetization in A (100) [001] Fe–3wt% Si polycrystal influenced by a [100] magnetic field white synchrotron radiation (Bragg reflection) topography

J. Stephenson, T. Tuomi, Väinö Kelhä

Research output: Contribution to journalArticleScientificpeer-review

9 Citations (Scopus)

Abstract

White synchrotron radiation (DORIS, Hamburg) is used in Bragg reflection topography to observe magnetic stripe domain behaviour in a (100) Fe–3wt% Si polycrystal subjected to both, [010] compressive and [100] magnetic field stresses. Each type of increased stress creates [010] stripe domain climb through inherent [001] stripe domains. A bulk defect is detected from surface (distorted stripe domain) stress patterns.

Original languageEnglish
Pages (from-to)191 - 202
Number of pages12
JournalPhysica Status Solidi A: Applied Research
Volume57
Issue number1
DOIs
Publication statusPublished - 1980
MoE publication typeNot Eligible

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Polycrystals
polycrystals
Synchrotron radiation
Topography
Magnetization
topography
synchrotron radiation
Magnetic fields
magnetization
magnetic fields
Magnetic domains
magnetic domains
Defects
defects

Cite this

@article{8484eeddbcbb47e19e3c9d86124ca68e,
title = "Stress‐induced magnetization in A (100) [001] Fe–3wt{\%} Si polycrystal influenced by a [100] magnetic field white synchrotron radiation (Bragg reflection) topography",
abstract = "White synchrotron radiation (DORIS, Hamburg) is used in Bragg reflection topography to observe magnetic stripe domain behaviour in a (100) Fe–3wt{\%} Si polycrystal subjected to both, [010] compressive and [100] magnetic field stresses. Each type of increased stress creates [010] stripe domain climb through inherent [001] stripe domains. A bulk defect is detected from surface (distorted stripe domain) stress patterns.",
author = "J. Stephenson and T. Tuomi and V{\"a}in{\"o} Kelh{\"a}",
year = "1980",
doi = "10.1002/pssa.2210570120",
language = "English",
volume = "57",
pages = "191 -- 202",
journal = "Physica Status Solidi A: Applications and Materials Science",
issn = "1862-6300",
publisher = "Wiley",
number = "1",

}

Stress‐induced magnetization in A (100) [001] Fe–3wt% Si polycrystal influenced by a [100] magnetic field white synchrotron radiation (Bragg reflection) topography. / Stephenson, J.; Tuomi, T.; Kelhä, Väinö.

In: Physica Status Solidi A: Applied Research, Vol. 57, No. 1, 1980, p. 191 - 202.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - Stress‐induced magnetization in A (100) [001] Fe–3wt% Si polycrystal influenced by a [100] magnetic field white synchrotron radiation (Bragg reflection) topography

AU - Stephenson, J.

AU - Tuomi, T.

AU - Kelhä, Väinö

PY - 1980

Y1 - 1980

N2 - White synchrotron radiation (DORIS, Hamburg) is used in Bragg reflection topography to observe magnetic stripe domain behaviour in a (100) Fe–3wt% Si polycrystal subjected to both, [010] compressive and [100] magnetic field stresses. Each type of increased stress creates [010] stripe domain climb through inherent [001] stripe domains. A bulk defect is detected from surface (distorted stripe domain) stress patterns.

AB - White synchrotron radiation (DORIS, Hamburg) is used in Bragg reflection topography to observe magnetic stripe domain behaviour in a (100) Fe–3wt% Si polycrystal subjected to both, [010] compressive and [100] magnetic field stresses. Each type of increased stress creates [010] stripe domain climb through inherent [001] stripe domains. A bulk defect is detected from surface (distorted stripe domain) stress patterns.

U2 - 10.1002/pssa.2210570120

DO - 10.1002/pssa.2210570120

M3 - Article

VL - 57

SP - 191

EP - 202

JO - Physica Status Solidi A: Applications and Materials Science

JF - Physica Status Solidi A: Applications and Materials Science

SN - 1862-6300

IS - 1

ER -