Abstract
White synchrotron radiation (DORIS, Hamburg) is used in Bragg reflection topography to observe magnetic stripe domain behaviour in a (100) Fe–3wt% Si polycrystal subjected to both, [010] compressive and [100] magnetic field stresses. Each type of increased stress creates [010] stripe domain climb through inherent [001] stripe domains. A bulk defect is detected from surface (distorted stripe domain) stress patterns.
| Original language | English |
|---|---|
| Pages (from-to) | 191 - 202 |
| Number of pages | 12 |
| Journal | Physica Status Solidi A: Applied Research |
| Volume | 57 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 1980 |
| MoE publication type | Not Eligible |
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Stress‐induced magnetization in A (100) [001] Fe–3wt% Si polycrystal influenced by a [100] magnetic field white synchrotron radiation (Bragg reflection) topography. / Stephenson, J.; Tuomi, T.; Kelhä, Väinö.
In: Physica Status Solidi A: Applied Research, Vol. 57, No. 1, 1980, p. 191 - 202.Research output: Contribution to journal › Article › Scientific › peer-review
TY - JOUR
T1 - Stress‐induced magnetization in A (100) [001] Fe–3wt% Si polycrystal influenced by a [100] magnetic field white synchrotron radiation (Bragg reflection) topography
AU - Stephenson, J.
AU - Tuomi, T.
AU - Kelhä, Väinö
PY - 1980
Y1 - 1980
N2 - White synchrotron radiation (DORIS, Hamburg) is used in Bragg reflection topography to observe magnetic stripe domain behaviour in a (100) Fe–3wt% Si polycrystal subjected to both, [010] compressive and [100] magnetic field stresses. Each type of increased stress creates [010] stripe domain climb through inherent [001] stripe domains. A bulk defect is detected from surface (distorted stripe domain) stress patterns.
AB - White synchrotron radiation (DORIS, Hamburg) is used in Bragg reflection topography to observe magnetic stripe domain behaviour in a (100) Fe–3wt% Si polycrystal subjected to both, [010] compressive and [100] magnetic field stresses. Each type of increased stress creates [010] stripe domain climb through inherent [001] stripe domains. A bulk defect is detected from surface (distorted stripe domain) stress patterns.
U2 - 10.1002/pssa.2210570120
DO - 10.1002/pssa.2210570120
M3 - Article
VL - 57
SP - 191
EP - 202
JO - Physica Status Solidi A: Applications and Materials Science
JF - Physica Status Solidi A: Applications and Materials Science
SN - 1862-6300
IS - 1
ER -