Structural investigation of re-deposited layers in JET

Jari Likonen (Corresponding Author), E. Vainonen-Ahlgren, L. Khriachtchev, J. P. Coad, M. Rubel, T. Renvall, K. Arstila, D. E. Hole, JET-EFDA contributors

    Research output: Contribution to journalArticleScientificpeer-review

    9 Citations (Scopus)


    JET Mk-II Gas Box divertor tiles exposed in 1998–2001 have been analysed with various ion beam techniques, secondary ion mass spectrometry (SIMS) and Raman spectroscopy. Inner divertor wall tiles removed in 2001 were covered with a duplex film. The inner layer was very rich in metallic impurities, with Be/C ∼ 1 and H-isotopes only present at low concentrations. The outer layer contained higher concentrations of D than normal for plasma-facing surfaces in JET (D/C ∼ 0.4), and Be/C ∼ 0.14. Raman and SIMS analyses show that the deposited films on inner divertor tiles are hydrogenated amorphous carbon with low sp3 fractions. The deposits have polymeric structure and low density. Both Raman scattering and SIMS indicate that films on inner divertor wall Tiles 1 and 3, and on floor Tile 4 have some differences in the chemical structure of the deposited films
    Original languageEnglish
    Pages (from-to)486-491
    Number of pages6
    JournalJournal of Nuclear Materials
    Issue number3
    Publication statusPublished - 2008
    MoE publication typeA1 Journal article-refereed


    • JET
    • JET divertor
    • divertor
    • divertor tiles
    • plasma
    • plasma-wall interactions


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